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P P Naulleau

Showing results (1-10 of 5) with videos related to

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Applied Optics|March 6, 2008
Dual-domain point diffraction interferometerP P Naulleau, K A Goldberg
Journal of Synchrotron Radiation|April 13, 2006
Transmission phase gratings for EUV interferometryP P Naulleau, C H Cho, E M Gullikson, et al.
Applied Optics|February 15, 2008
Ensemble-averaged Shack-Hartmann wave-front sensing for imaging through turbid mediaE N Leith, B G Hoover, D S Dilworth, et al.
Applied Optics|March 25, 2008
Tolerancing of diffraction-limited Kirkpatrick-Baez synchrotron beamline optics for extreme-ultraviolet metrologyP P Naulleau, K A Goldberg, P J Batson, et al.
Applied Optics|March 8, 2008
Extreme-ultraviolet phase-shifting point-diffraction interferometer: a wave-front metrology tool with subangstrom reference-wave accuracyP P Naulleau, K A Goldberg, S H Lee, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Applied Optics|March 6, 2008
Dual-domain point diffraction interferometerP P Naulleau, K A Goldberg
Journal of Synchrotron Radiation|April 13, 2006
Transmission phase gratings for EUV interferometryP P Naulleau, C H Cho, E M Gullikson, et al.
Applied Optics|February 15, 2008
Ensemble-averaged Shack-Hartmann wave-front sensing for imaging through turbid mediaE N Leith, B G Hoover, D S Dilworth, et al.
Applied Optics|March 25, 2008
Tolerancing of diffraction-limited Kirkpatrick-Baez synchrotron beamline optics for extreme-ultraviolet metrologyP P Naulleau, K A Goldberg, P J Batson, et al.
Applied Optics|March 8, 2008
Extreme-ultraviolet phase-shifting point-diffraction interferometer: a wave-front metrology tool with subangstrom reference-wave accuracyP P Naulleau, K A Goldberg, S H Lee, et al.
Pageof 1