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Paul T Blanchard

Showing results (1-10 of 17) with videos related to

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Journal of Visualized Experiments : Jove|December 5, 2013
Analysis of contact interfaces for single GaN nanowire devicesAndrew M Herrero, Paul T Blanchard, Kris A Bertness
Physica Status Solidi. B, Basic Solid State Physics : PSS|December 18, 2020
Eutectic Formation, V/III Ratio and Controlled Polarity Inversion in Nitrides on Silicon<sup>[1]</sup>Alexana Roshko, Matt D Brubaker, Paul T Blanchard, et al.
The Journal of Physical Chemistry. C, Nanomaterials and Interfaces|October 26, 2020
Electron-Enhanced Atomic Layer Deposition of Boron Nitride Thin Films at Room Temperature and 100 °CJaclyn K Sprenger, Huaxing Sun, Andrew S Cavanagh, et al.
Ultramicroscopy|May 15, 2020
An algorithm for correcting systematic energy deficits in the atom probe mass spectra of insulating samplesBenjamin W Caplins, Paul T Blanchard, Ann N Chiaramonti, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 18, 2022
Atom Probe Tomography Using a Wavelength-Tunable Femtosecond-Pulsed Coherent Extreme Ultraviolet Light SourceAnn N Chiaramonti, Luis Miaja-Avila, Paul T Blanchard, et al.
MRS Advances|December 1, 2022
A Three-Dimensional Atom Probe Microscope Incorporating a Wavelength-Tuneable Femtosecond-Pulsed Coherent Extreme Ultraviolet Light SourceAnn N Chiaramonti, Luis Miaja-Avila, Paul T Blanchard, et al.
Nanotechnology|August 23, 2012
Microstructure evolution and development of annealed Ni/Au contacts to GaN nanowiresAndrew M Herrero, Paul T Blanchard, Aric Sanders, et al.
Journal of Materials Research|July 6, 2019
Comparison of convergent beam electron diffraction and annular bright field atomic imaging for GaN polarity determinationAlexana Roshko, Matt D Brubaker, Paul T Blanchard, et al.
Nanotechnology|February 19, 2019
UV LEDs based on p-i-n core-shell AlGaN/GaN nanowire heterostructures grown by N-polar selective area epitaxyMatt D Brubaker, Kristen L Genter, Alexana Roshko, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 13, 2020
Field Ion Emission in an Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet LightAnn N Chiaramonti, Luis Miaja-Avila, Benjamin W Caplins, et al.
Pageof 2

Showing results (1-10 of 17) with videos related to

Sort By:
Pageof 2
Journal of Visualized Experiments : Jove|December 5, 2013
Analysis of contact interfaces for single GaN nanowire devicesAndrew M Herrero, Paul T Blanchard, Kris A Bertness
Physica Status Solidi. B, Basic Solid State Physics : PSS|December 18, 2020
Eutectic Formation, V/III Ratio and Controlled Polarity Inversion in Nitrides on Silicon<sup>[1]</sup>Alexana Roshko, Matt D Brubaker, Paul T Blanchard, et al.
The Journal of Physical Chemistry. C, Nanomaterials and Interfaces|October 26, 2020
Electron-Enhanced Atomic Layer Deposition of Boron Nitride Thin Films at Room Temperature and 100 °CJaclyn K Sprenger, Huaxing Sun, Andrew S Cavanagh, et al.
Ultramicroscopy|May 15, 2020
An algorithm for correcting systematic energy deficits in the atom probe mass spectra of insulating samplesBenjamin W Caplins, Paul T Blanchard, Ann N Chiaramonti, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 18, 2022
Atom Probe Tomography Using a Wavelength-Tunable Femtosecond-Pulsed Coherent Extreme Ultraviolet Light SourceAnn N Chiaramonti, Luis Miaja-Avila, Paul T Blanchard, et al.
MRS Advances|December 1, 2022
A Three-Dimensional Atom Probe Microscope Incorporating a Wavelength-Tuneable Femtosecond-Pulsed Coherent Extreme Ultraviolet Light SourceAnn N Chiaramonti, Luis Miaja-Avila, Paul T Blanchard, et al.
Nanotechnology|August 23, 2012
Microstructure evolution and development of annealed Ni/Au contacts to GaN nanowiresAndrew M Herrero, Paul T Blanchard, Aric Sanders, et al.
Journal of Materials Research|July 6, 2019
Comparison of convergent beam electron diffraction and annular bright field atomic imaging for GaN polarity determinationAlexana Roshko, Matt D Brubaker, Paul T Blanchard, et al.
Nanotechnology|February 19, 2019
UV LEDs based on p-i-n core-shell AlGaN/GaN nanowire heterostructures grown by N-polar selective area epitaxyMatt D Brubaker, Kristen L Genter, Alexana Roshko, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 13, 2020
Field Ion Emission in an Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet LightAnn N Chiaramonti, Luis Miaja-Avila, Benjamin W Caplins, et al.
Pageof 2