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Peter D Nellist

Showing results (1-10 of 62) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 16, 2013
Identifying and correcting scan noise and drift in the scanning transmission electron microscopeLewys Jones, Peter D Nellist
Micron (Oxford, England : 1993)|January 29, 2014
Testing the accuracy of the two-dimensional object model in HAADF STEMLewys Jones, Peter D Nellist
Journal of Electron Microscopy|August 31, 2004
HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysisYiping Peng, Peter D Nellist, Stephen J Pennycook
Ultramicroscopy|December 8, 2014
Efficient phase contrast imaging in STEM using a pixelated detector. Part II: optimisation of imaging conditionsHao Yang, Timothy J Pennycook, Peter D Nellist
Ultramicroscopy|September 25, 2016
Enhanced phase contrast transfer using ptychography combined with a pre-specimen phase plate in a scanning transmission electron microscopeHao Yang, Peter Ercius, Peter D Nellist, et al.
Philosophical Transactions. Series A, Mathematical, Physical, and Engineering Sciences|August 19, 2009
New possibilities with aberration-corrected electron microscopyDavid Cockayne, Angus I Kirkland, Peter D Nellist, et al.
ACS Nano|February 2, 2010
Dependence of surface facet period on the diameter of nanowiresFang Li, Peter D Nellist, Christian Lang, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 29, 2026
Detective Quantum Efficiency-Based Comparison of HRTEM and Ptychography Phase ImagingFelix Bennemann, Angus I Kirkland, David A Muller, et al.
Philosophical Transactions. Series A, Mathematical, Physical, and Engineering Sciences|August 19, 2009
Three-dimensional imaging by optical sectioning in the aberration-corrected scanning transmission electron microscopeG Behan, E C Cosgriff, Angus I Kirkland, et al.
Ultramicroscopy|October 27, 2018
High dose efficiency atomic resolution imaging via electron ptychographyTimothy J Pennycook, Gerardo T Martinez, Peter D Nellist, et al.
Pageof 7

Showing results (1-10 of 62) with videos related to

Sort By:
Pageof 7
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 16, 2013
Identifying and correcting scan noise and drift in the scanning transmission electron microscopeLewys Jones, Peter D Nellist
Micron (Oxford, England : 1993)|January 29, 2014
Testing the accuracy of the two-dimensional object model in HAADF STEMLewys Jones, Peter D Nellist
Journal of Electron Microscopy|August 31, 2004
HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysisYiping Peng, Peter D Nellist, Stephen J Pennycook
Ultramicroscopy|December 8, 2014
Efficient phase contrast imaging in STEM using a pixelated detector. Part II: optimisation of imaging conditionsHao Yang, Timothy J Pennycook, Peter D Nellist
Ultramicroscopy|September 25, 2016
Enhanced phase contrast transfer using ptychography combined with a pre-specimen phase plate in a scanning transmission electron microscopeHao Yang, Peter Ercius, Peter D Nellist, et al.
Philosophical Transactions. Series A, Mathematical, Physical, and Engineering Sciences|August 19, 2009
New possibilities with aberration-corrected electron microscopyDavid Cockayne, Angus I Kirkland, Peter D Nellist, et al.
ACS Nano|February 2, 2010
Dependence of surface facet period on the diameter of nanowiresFang Li, Peter D Nellist, Christian Lang, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 29, 2026
Detective Quantum Efficiency-Based Comparison of HRTEM and Ptychography Phase ImagingFelix Bennemann, Angus I Kirkland, David A Muller, et al.
Philosophical Transactions. Series A, Mathematical, Physical, and Engineering Sciences|August 19, 2009
Three-dimensional imaging by optical sectioning in the aberration-corrected scanning transmission electron microscopeG Behan, E C Cosgriff, Angus I Kirkland, et al.
Ultramicroscopy|October 27, 2018
High dose efficiency atomic resolution imaging via electron ptychographyTimothy J Pennycook, Gerardo T Martinez, Peter D Nellist, et al.
Pageof 7