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The Review of Scientific Instruments|May 3, 2018
Metrological 2iOF fibre-optic system for position and displacement measurement with 31 pm resolutionKarolina Orłowska, Michał Świątkowski, Piotr Kunicki, et al.
Applied Optics|August 10, 2016
High-resolution and wide-bandwidth light intensity fiber optic displacement sensor for MEMS metrologyKarolina Orłowska, Michał Świątkowski, Piotr Kunicki, et al.
Sensors (Basel, Switzerland)|October 17, 2019
Sensitivity Improvement to Active Piezoresistive AFM Probes Using Focused Ion Beam ProcessingPiotr Kunicki, Tihomir Angelov, Tzvetan Ivanov, et al.
Nanotechnology|December 8, 2023
Electrical, thermal and noise properties of platinum-carbon free-standing nanowires designed as nanoscale resistive thermal devicesTomasz Piasecki, Krzysztof Kwoka, Ewelina Gacka, et al.
Micron (Oxford, England : 1993)|December 8, 2019
Quartz tuning fork mass change sensing for FIB/SEM technologyPiotr Kunicki, Magdalena Moczała-Dusanowska, Grzegorz Jóźwiak, et al.
Ultramicroscopy|July 6, 2018
Thermal nanometrology using piezoresistive SThM probes with metallic tipsPaweł Janus, Andrzej Sierakowski, Maciej Rudek, et al.
Acta of Bioengineering and Biomechanics|February 6, 2020
Analysis of the electrolytically polished skeletal dentures surfaces using various nano- and microscopic technologiesTomasz Dąbrowa, Wojciech Majstrzyk, Magdalena Tamulewicz, et al.
Beilstein Journal of Nanotechnology|October 29, 2024
New design of operational MEMS bridges for measurements of properties of FEBID-based nanostructuresBartosz Pruchnik, Krzysztof Kwoka, Ewelina Gacka, et al.
Ultramicroscopy|March 18, 2023
Novel type of whisker-tip cantilever based on GaN microrods for atomic force microscopyEwelina Gacka, Piotr Kunicki, Paulina Łysik, et al.
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