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R W E van de Kruijs

Showing results (1-10 of 15) with videos related to

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The Review of Scientific Instruments|June 6, 2018
Self-contained in-vacuum in situ thin film stress measurement toolJ Reinink, R W E van de Kruijs, F Bijkerk
Optics Express|February 12, 2014
Subwavelength single layer absorption resonance antireflection coatingsS P Huber, R W E van de Kruijs, A E Yakshin, et al.
Optics Letters|August 15, 2015
High-reflectance La/B-based multilayer mirror for 6.x  nm wavelengthD S Kuznetsov, A E Yakshin, J M Sturm, et al.
Acta Crystallographica. Section A, Foundations and Advances|September 6, 2018
Specular reflection intensity modulated by grazing-incidence diffraction in a wide angular rangeK V Nikolaev, I A Makhotkin, S N Yakunin, et al.
Optics Express|October 17, 2014
Combined EUV reflectance and X-ray reflectivity data analysis of periodic multilayer structuresS N Yakunin, I A Makhotkin, K V Nikolaev, et al.
Physical Chemistry Chemical Physics : PCCP|February 3, 2017
Determining crystal phase purity in c-BP through X-ray absorption spectroscopyS P Huber, V V Medvedev, E Gullikson, et al.
Optics Letters|April 3, 2012
Infrared antireflective filtering for extreme ultraviolet multilayer Bragg reflectorsV V Medvedev, A E Yakshin, R W E van de Kruijs, et al.
Optics Letters|September 3, 2011
Infrared suppression by hybrid EUV multilayer--IR etalon structuresV V Medvedev, A E Yakshin, R W E van de Kruijs, et al.
Optics Express|March 10, 2018
Narrowband and tunable anomalous transmission filters for spectral monitoring in the extreme ultraviolet wavelength regionJ L P Barreaux, I V Kozhevnikov, M Bayraktar, et al.
Journal of Synchrotron Radiation|March 11, 2020
A semi-analytical approach for the characterization of ordered 3D nanostructures using grazing-incidence X-ray fluorescenceK V Nikolaev, V Soltwisch, P Hönicke, et al.
Pageof 2

Showing results (1-10 of 15) with videos related to

Sort By:
Pageof 2
The Review of Scientific Instruments|June 6, 2018
Self-contained in-vacuum in situ thin film stress measurement toolJ Reinink, R W E van de Kruijs, F Bijkerk
Optics Express|February 12, 2014
Subwavelength single layer absorption resonance antireflection coatingsS P Huber, R W E van de Kruijs, A E Yakshin, et al.
Optics Letters|August 15, 2015
High-reflectance La/B-based multilayer mirror for 6.x  nm wavelengthD S Kuznetsov, A E Yakshin, J M Sturm, et al.
Acta Crystallographica. Section A, Foundations and Advances|September 6, 2018
Specular reflection intensity modulated by grazing-incidence diffraction in a wide angular rangeK V Nikolaev, I A Makhotkin, S N Yakunin, et al.
Optics Express|October 17, 2014
Combined EUV reflectance and X-ray reflectivity data analysis of periodic multilayer structuresS N Yakunin, I A Makhotkin, K V Nikolaev, et al.
Physical Chemistry Chemical Physics : PCCP|February 3, 2017
Determining crystal phase purity in c-BP through X-ray absorption spectroscopyS P Huber, V V Medvedev, E Gullikson, et al.
Optics Letters|April 3, 2012
Infrared antireflective filtering for extreme ultraviolet multilayer Bragg reflectorsV V Medvedev, A E Yakshin, R W E van de Kruijs, et al.
Optics Letters|September 3, 2011
Infrared suppression by hybrid EUV multilayer--IR etalon structuresV V Medvedev, A E Yakshin, R W E van de Kruijs, et al.
Optics Express|March 10, 2018
Narrowband and tunable anomalous transmission filters for spectral monitoring in the extreme ultraviolet wavelength regionJ L P Barreaux, I V Kozhevnikov, M Bayraktar, et al.
Journal of Synchrotron Radiation|March 11, 2020
A semi-analytical approach for the characterization of ordered 3D nanostructures using grazing-incidence X-ray fluorescenceK V Nikolaev, V Soltwisch, P Hönicke, et al.
Pageof 2