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Robert F Cook

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Applied Physics Letters|October 9, 2024
High-throughput bend-strengths of ultra-small polysilicon MEMS componentsRobert F Cook, Brad L Boyce, Lawrence H Friedman, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|October 21, 2009
Elastic, adhesive, and charge transport properties of a metal-molecule-metal junction: the role of molecular orientation, order, and coverageFrank W DelRio, Kristen L Steffens, Cherno Jaye, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|January 29, 2010
Nanomechanical properties of thin films of type I collagen fibrilsKoo-Hyun Chung, Kiran Bhadriraju, Tighe A Spurlin, et al.
Soft Matter|August 11, 2015
Mechanical measurements of heterogeneity and length scale effects in PEG-based hydrogelsBrian G Bush, Jenna M Shapiro, Frank W DelRio, et al.
Nanoscale|May 10, 2013
Surface-engineered nanomaterials as X-ray absorbing adjuvant agents for Auger-mediated chemo-radiationSang-Min Lee, De-Hao Tsai, Vincent A Hackley, et al.
Methods in Molecular Biology (Clifton, N.J.)|December 1, 2010
Size measurement of nanoparticles using atomic force microscopyJaroslaw Grobelny, Frank W DelRio, Namboodiri Pradeep, et al.
Nanotechnology|June 22, 2016
Near-theoretical fracture strengths in native and oxidized silicon nanowiresFrank W DelRio, Ryan M White, Sergiy Krylyuk, et al.
The Review of Scientific Instruments|December 3, 2013
Accurate spring constant calibration for very stiff atomic force microscopy cantileversScott J Grutzik, Richard S Gates, Yvonne B Gerbig, et al.
Ultramicroscopy|March 4, 2016
Assessing strain mapping by electron backscatter diffraction and confocal Raman microscopy using wedge-indented SiLawrence H Friedman, Mark D Vaudin, Stephan J Stranick, et al.
Journal of Applied Physics|January 20, 2025
Two-dimensional strain-mapping by electron backscatter diffraction and confocal Raman spectroscopyAndrew J Gayle, Lawrence H Friedman, Ryan Beams, et al.
Pageof 3

Showing results (21-30 of 30) with videos related to

Sort By:
Pageof 3
You have reached the last page of results.This site can display upto 30 results.
Applied Physics Letters|October 9, 2024
High-throughput bend-strengths of ultra-small polysilicon MEMS componentsRobert F Cook, Brad L Boyce, Lawrence H Friedman, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|October 21, 2009
Elastic, adhesive, and charge transport properties of a metal-molecule-metal junction: the role of molecular orientation, order, and coverageFrank W DelRio, Kristen L Steffens, Cherno Jaye, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|January 29, 2010
Nanomechanical properties of thin films of type I collagen fibrilsKoo-Hyun Chung, Kiran Bhadriraju, Tighe A Spurlin, et al.
Soft Matter|August 11, 2015
Mechanical measurements of heterogeneity and length scale effects in PEG-based hydrogelsBrian G Bush, Jenna M Shapiro, Frank W DelRio, et al.
Nanoscale|May 10, 2013
Surface-engineered nanomaterials as X-ray absorbing adjuvant agents for Auger-mediated chemo-radiationSang-Min Lee, De-Hao Tsai, Vincent A Hackley, et al.
Methods in Molecular Biology (Clifton, N.J.)|December 1, 2010
Size measurement of nanoparticles using atomic force microscopyJaroslaw Grobelny, Frank W DelRio, Namboodiri Pradeep, et al.
Nanotechnology|June 22, 2016
Near-theoretical fracture strengths in native and oxidized silicon nanowiresFrank W DelRio, Ryan M White, Sergiy Krylyuk, et al.
The Review of Scientific Instruments|December 3, 2013
Accurate spring constant calibration for very stiff atomic force microscopy cantileversScott J Grutzik, Richard S Gates, Yvonne B Gerbig, et al.
Ultramicroscopy|March 4, 2016
Assessing strain mapping by electron backscatter diffraction and confocal Raman microscopy using wedge-indented SiLawrence H Friedman, Mark D Vaudin, Stephan J Stranick, et al.
Journal of Applied Physics|January 20, 2025
Two-dimensional strain-mapping by electron backscatter diffraction and confocal Raman spectroscopyAndrew J Gayle, Lawrence H Friedman, Ryan Beams, et al.
Pageof 3