Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Ronald G Dixson

Showing results (1-10 of 11) with videos related to

Pageof 2
Sort By:
Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3|November 1, 2024
Multiple-Instrument Evaluation of the Consistency and Long Term Stability of Tip Width Calibration for Critical Dimension Atomic Force MicroscopyRonald G Dixson, Ndubuisi G Orji
Measurement Science & Technology|October 31, 2024
Comparison of line width calibration using critical dimension atomic force microscopes between PTB and NISTGaoliang Dai, Kai Hahm, Harald Bosse, et al.
Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3|April 19, 2016
Lateral Tip Control Effects in CD-AFM Metrology: The Large Tip LimitRonald G Dixson, Ndubuisi G Orji, Ryan S Goldband
Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3|December 11, 2020
Wear comparison of critical dimension-atomic force microscopy tipsNdubuisi G Orji, Ronald G Dixson, Ernesto Lopez, et al.
Scanning|January 18, 2008
Computational models of a nano probe tip for static behaviorsShaw C Feng, Theodore V Vorburger, Che Bong Joung, et al.
Light, Science & Applications|March 1, 2016
Deep-subwavelength Nanometric Image Reconstruction using Fourier Domain Optical NormalizationJing Qin, Richard M Silver, Bryan M Barnes, et al.
Ultramicroscopy|January 1, 2016
Tip characterization method using multi-feature characterizer for CD-AFMNdubuisi G Orji, Hiroshi Itoh, Chumei Wang, et al.
Journal of Research of the National Institute of Standards and Technology|June 9, 2016
RM 8111: Development of a Prototype Linewidth StandardMichael W Cresswell, William F Guthrie, Ronald G Dixson, et al.
Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3|November 15, 2016
Evaluation of carbon nanotube probes in critical dimension atomic force microscopesJinho Choi, Byong Chon Park, Sang Jung Ahn, et al.
Optica Quantum|May 14, 2024
Traceable localization enables accurate integration of quantum emitters and photonic structures with high yieldCraig R Copeland, Adam L Pintar, Ronald G Dixson, et al.
Pageof 2

Showing results (1-10 of 11) with videos related to

Sort By:
Pageof 2
Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3|November 1, 2024
Multiple-Instrument Evaluation of the Consistency and Long Term Stability of Tip Width Calibration for Critical Dimension Atomic Force MicroscopyRonald G Dixson, Ndubuisi G Orji
Measurement Science & Technology|October 31, 2024
Comparison of line width calibration using critical dimension atomic force microscopes between PTB and NISTGaoliang Dai, Kai Hahm, Harald Bosse, et al.
Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3|April 19, 2016
Lateral Tip Control Effects in CD-AFM Metrology: The Large Tip LimitRonald G Dixson, Ndubuisi G Orji, Ryan S Goldband
Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3|December 11, 2020
Wear comparison of critical dimension-atomic force microscopy tipsNdubuisi G Orji, Ronald G Dixson, Ernesto Lopez, et al.
Scanning|January 18, 2008
Computational models of a nano probe tip for static behaviorsShaw C Feng, Theodore V Vorburger, Che Bong Joung, et al.
Light, Science & Applications|March 1, 2016
Deep-subwavelength Nanometric Image Reconstruction using Fourier Domain Optical NormalizationJing Qin, Richard M Silver, Bryan M Barnes, et al.
Ultramicroscopy|January 1, 2016
Tip characterization method using multi-feature characterizer for CD-AFMNdubuisi G Orji, Hiroshi Itoh, Chumei Wang, et al.
Journal of Research of the National Institute of Standards and Technology|June 9, 2016
RM 8111: Development of a Prototype Linewidth StandardMichael W Cresswell, William F Guthrie, Ronald G Dixson, et al.
Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3|November 15, 2016
Evaluation of carbon nanotube probes in critical dimension atomic force microscopesJinho Choi, Byong Chon Park, Sang Jung Ahn, et al.
Optica Quantum|May 14, 2024
Traceable localization enables accurate integration of quantum emitters and photonic structures with high yieldCraig R Copeland, Adam L Pintar, Ronald G Dixson, et al.
Pageof 2