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Rutger M T Thijssen

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The Review of Scientific Instruments|October 2, 2020
Publisher's Note: "On the resolution of subsurface atomic force microscopy and its implications for subsurface feature sizing" [Rev. Sci. Instrum. 91, 083702 (2020)]Daniele Piras, Paul L M J van Neer, Rutger M T Thijssen, et al.
The Review of Scientific Instruments|September 3, 2020
On the resolution of subsurface atomic force microscopy and its implications for subsurface feature sizingDaniele Piras, Paul L M J van Neer, Rutger M T Thijssen, et al.
Ultramicroscopy|October 3, 2017
Mapping buried nanostructures using subsurface ultrasonic resonance force microscopyMaarten H van Es, Abbas Mohtashami, Rutger M T Thijssen, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
The Review of Scientific Instruments|October 2, 2020
Publisher's Note: "On the resolution of subsurface atomic force microscopy and its implications for subsurface feature sizing" [Rev. Sci. Instrum. 91, 083702 (2020)]Daniele Piras, Paul L M J van Neer, Rutger M T Thijssen, et al.
The Review of Scientific Instruments|September 3, 2020
On the resolution of subsurface atomic force microscopy and its implications for subsurface feature sizingDaniele Piras, Paul L M J van Neer, Rutger M T Thijssen, et al.
Ultramicroscopy|October 3, 2017
Mapping buried nanostructures using subsurface ultrasonic resonance force microscopyMaarten H van Es, Abbas Mohtashami, Rutger M T Thijssen, et al.
Pageof 1