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Sébastien Duguay

Showing results (1-10 of 7) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 10, 2015
A Meshless Algorithm to Model Field Evaporation in Atom Probe TomographyNicolas Rolland, François Vurpillot, Sébastien Duguay, et al.
Nanoscale Research Letters|December 7, 2013
Strain analysis for the prediction of the preferential nucleation sites of stacked quantum dots by combination of FEM and APTJesús Hernández-Saz, Miriam Herrera, Sébastien Duguay, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 23, 2017
New Atom Probe Tomography Reconstruction Algorithm for Multilayered Samples: Beyond the Hemispherical ConstraintNicolas Rolland, François Vurpillot, Sébastien Duguay, et al.
Nanotechnology|April 28, 2021
Controlling solid-liquid-solid GeSn nanowire growth modes by changing deposition sequences of a-Ge:H layer and SnO<sub>2</sub>nanoparticlesRuiling Gong, Edy Azrak, Celia Castro, et al.
Ultramicroscopy|March 28, 2015
Quantitative analysis of Si/SiGeC superlattices using atom probe tomographyRobert Estivill, Adeline Grenier, Sébastien Duguay, et al.
Ultramicroscopy|December 16, 2014
Quantitative investigation of SiGeC layers using atom probe tomographyRobert Estivill, Adeline Grenier, Sébastien Duguay, et al.
Nano Letters|March 5, 2014
Extended defects formation in nanosecond laser-annealed ion implanted siliconYang Qiu, Fuccio Cristiano, Karim Huet, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 10, 2015
A Meshless Algorithm to Model Field Evaporation in Atom Probe TomographyNicolas Rolland, François Vurpillot, Sébastien Duguay, et al.
Nanoscale Research Letters|December 7, 2013
Strain analysis for the prediction of the preferential nucleation sites of stacked quantum dots by combination of FEM and APTJesús Hernández-Saz, Miriam Herrera, Sébastien Duguay, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 23, 2017
New Atom Probe Tomography Reconstruction Algorithm for Multilayered Samples: Beyond the Hemispherical ConstraintNicolas Rolland, François Vurpillot, Sébastien Duguay, et al.
Nanotechnology|April 28, 2021
Controlling solid-liquid-solid GeSn nanowire growth modes by changing deposition sequences of a-Ge:H layer and SnO<sub>2</sub>nanoparticlesRuiling Gong, Edy Azrak, Celia Castro, et al.
Ultramicroscopy|March 28, 2015
Quantitative analysis of Si/SiGeC superlattices using atom probe tomographyRobert Estivill, Adeline Grenier, Sébastien Duguay, et al.
Ultramicroscopy|December 16, 2014
Quantitative investigation of SiGeC layers using atom probe tomographyRobert Estivill, Adeline Grenier, Sébastien Duguay, et al.
Nano Letters|March 5, 2014
Extended defects formation in nanosecond laser-annealed ion implanted siliconYang Qiu, Fuccio Cristiano, Karim Huet, et al.
Pageof 1