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S Van Aert

Showing results (11-20 of 57) with videos related to

Pageof 6
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Ultramicroscopy|February 22, 2012
Precision of three-dimensional atomic scale measurements from HRTEM images: what are the limits?A Wang, S Van Aert, P Goos, et al.
Micron (Oxford, England : 1993)|May 4, 2004
How to optimize the experimental design of quantitative atomic resolution TEM experiments?S Van Aert, A J den Dekker, D Van Dyck
Ultramicroscopy|June 18, 2013
An alternative approach to determine attainable resolution directly from HREM imagesA Wang, S Turner, S Van Aert, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 13, 2004
Physical limits on atomic resolutionD Van Dyck, S Van Aert, A J den Dekker
Ultramicroscopy|September 22, 2009
A model based atomic resolution tomographic algorithmW Van den Broek, S Van Aert, D Van Dyck
Ultramicroscopy|August 26, 2011
A method to determine the local surface profile from reconstructed exit wavesA Wang, F R Chen, S Van Aert, et al.
Science and Technology of Advanced Materials|November 24, 2016
Advanced three-dimensional electron microscopy techniques in the quest for better structural and functional materialsD Schryvers, S Cao, W Tirry, et al.
Ultramicroscopy|December 16, 2014
Optimal experimental design for nano-particle atom-counting from high-resolution STEM imagesA De Backer, A De Wael, J Gonnissen, et al.
Ultramicroscopy|June 14, 2013
Atom counting in HAADF STEM using a statistical model-based approach: methodology, possibilities, and inherent limitationsA De Backer, G T Martinez, A Rosenauer, et al.
Ultramicroscopy|October 13, 2022
Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectorsD G Sentürk, A De Backer, T Friedrich, et al.
Pageof 6

Showing results (11-20 of 57) with videos related to

Sort By:
Pageof 6
Ultramicroscopy|February 22, 2012
Precision of three-dimensional atomic scale measurements from HRTEM images: what are the limits?A Wang, S Van Aert, P Goos, et al.
Micron (Oxford, England : 1993)|May 4, 2004
How to optimize the experimental design of quantitative atomic resolution TEM experiments?S Van Aert, A J den Dekker, D Van Dyck
Ultramicroscopy|June 18, 2013
An alternative approach to determine attainable resolution directly from HREM imagesA Wang, S Turner, S Van Aert, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 13, 2004
Physical limits on atomic resolutionD Van Dyck, S Van Aert, A J den Dekker
Ultramicroscopy|September 22, 2009
A model based atomic resolution tomographic algorithmW Van den Broek, S Van Aert, D Van Dyck
Ultramicroscopy|August 26, 2011
A method to determine the local surface profile from reconstructed exit wavesA Wang, F R Chen, S Van Aert, et al.
Science and Technology of Advanced Materials|November 24, 2016
Advanced three-dimensional electron microscopy techniques in the quest for better structural and functional materialsD Schryvers, S Cao, W Tirry, et al.
Ultramicroscopy|December 16, 2014
Optimal experimental design for nano-particle atom-counting from high-resolution STEM imagesA De Backer, A De Wael, J Gonnissen, et al.
Ultramicroscopy|June 14, 2013
Atom counting in HAADF STEM using a statistical model-based approach: methodology, possibilities, and inherent limitationsA De Backer, G T Martinez, A Rosenauer, et al.
Ultramicroscopy|October 13, 2022
Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectorsD G Sentürk, A De Backer, T Friedrich, et al.
Pageof 6