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S Van Aert

Showing results (31-40 of 57) with videos related to

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Ultramicroscopy|April 11, 2002
Optimal experimental design of STEM measurement of atom column positionsS Van Aert, A J den Dekker, D Van Dyck, et al.
Ultramicroscopy|April 8, 2014
A memory efficient method for fully three-dimensional object reconstruction with HAADF STEMW Van den Broek, A Rosenauer, S Van Aert, et al.
Ultramicroscopy|March 10, 2017
Atom-counting in High Resolution Electron Microscopy:TEM or STEM - That's the questionJ Gonnissen, A De Backer, A J den Dekker, et al.
Ultramicroscopy|September 5, 2016
Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal designJ Gonnissen, A De Backer, A J den Dekker, et al.
Ultramicroscopy|December 27, 2008
Effect of amorphous layers on the interpretation of restored exit wavesS Van Aert, L Y Chang, S Bals, et al.
Ultramicroscopy|November 12, 2003
Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures?D Van Dyck, S Van Aert, A J den Dekker, et al.
Ultramicroscopy|June 21, 2014
Atomic resolution mapping of phonon excitations in STEM-EELS experimentsR Egoavil, N Gauquelin, G T Martinez, et al.
Ultramicroscopy|February 7, 2017
Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformationsD Schryvers, E K H Salje, M Nishida, et al.
Ultramicroscopy|September 14, 2020
Atom column detection from simultaneously acquired ABF and ADF STEM imagesJ Fatermans, A J den Dekker, K Müller-Caspary, et al.
Ultramicroscopy|January 5, 2002
Does a monochromator improve the precision in quantitative HRTEM?A J den Dekker, S Van Aert, D Van Dyck, et al.
Pageof 6

Showing results (31-40 of 57) with videos related to

Sort By:
Pageof 6
Ultramicroscopy|April 11, 2002
Optimal experimental design of STEM measurement of atom column positionsS Van Aert, A J den Dekker, D Van Dyck, et al.
Ultramicroscopy|April 8, 2014
A memory efficient method for fully three-dimensional object reconstruction with HAADF STEMW Van den Broek, A Rosenauer, S Van Aert, et al.
Ultramicroscopy|March 10, 2017
Atom-counting in High Resolution Electron Microscopy:TEM or STEM - That's the questionJ Gonnissen, A De Backer, A J den Dekker, et al.
Ultramicroscopy|September 5, 2016
Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal designJ Gonnissen, A De Backer, A J den Dekker, et al.
Ultramicroscopy|December 27, 2008
Effect of amorphous layers on the interpretation of restored exit wavesS Van Aert, L Y Chang, S Bals, et al.
Ultramicroscopy|November 12, 2003
Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures?D Van Dyck, S Van Aert, A J den Dekker, et al.
Ultramicroscopy|June 21, 2014
Atomic resolution mapping of phonon excitations in STEM-EELS experimentsR Egoavil, N Gauquelin, G T Martinez, et al.
Ultramicroscopy|February 7, 2017
Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformationsD Schryvers, E K H Salje, M Nishida, et al.
Ultramicroscopy|September 14, 2020
Atom column detection from simultaneously acquired ABF and ADF STEM imagesJ Fatermans, A J den Dekker, K Müller-Caspary, et al.
Ultramicroscopy|January 5, 2002
Does a monochromator improve the precision in quantitative HRTEM?A J den Dekker, S Van Aert, D Van Dyck, et al.
Pageof 6