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Sadao Yamazaki

Showing results (1-10 of 6) with videos related to

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Scanning|August 8, 2007
Quality improvement of environmental secondary electron detector signal using helium gas in variable pressure scanning electron microscopyEisaku Oho, Kazuhiko Suzuki, Sadao Yamazaki
Scanning|February 6, 2023
Technology for Fundamental Improvement of an Extremely Low-Quality Video Signal for Use in Fine Focusing and Astigmatism Correction in Scanning Electron MicroscopyEisaku Oho, Sadao Yamazaki, Kazuhiko Suzuki
Scanning|April 16, 2020
Applying Fast Scanning Method Coupled with Digital Image Processing Technology as Standard Acquisition Mode for Scanning Electron MicroscopyEisaku Oho, Kazuhiko Suzuki, Sadao Yamazaki
Microscopy (Oxford, England)|March 25, 2017
Support system for fine focusing and astigmatism correction using an auditory signal in scanning electron microscopyEisaku Oho, Kazuhiko Suzuki, Sadao Yamazaki
Scanning|December 6, 2021
Highly Reliable Method to Obtain a Correlation Coefficient Unaffected by the SEM Noise Component for Examining the Degree of Specimen Damage due to Electron Beam IrradiationEisaku Oho, Kazuhiko Suzuki, Sadao Yamazaki
Microscopy (Oxford, England)|June 19, 2014
A new field-of-view autotracking method for online tomography reconstruction based on back-projected ray image cross-correlationSachihiko Tomonaga, Misuzu Baba, Sadao Yamazaki, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Scanning|August 8, 2007
Quality improvement of environmental secondary electron detector signal using helium gas in variable pressure scanning electron microscopyEisaku Oho, Kazuhiko Suzuki, Sadao Yamazaki
Scanning|February 6, 2023
Technology for Fundamental Improvement of an Extremely Low-Quality Video Signal for Use in Fine Focusing and Astigmatism Correction in Scanning Electron MicroscopyEisaku Oho, Sadao Yamazaki, Kazuhiko Suzuki
Scanning|April 16, 2020
Applying Fast Scanning Method Coupled with Digital Image Processing Technology as Standard Acquisition Mode for Scanning Electron MicroscopyEisaku Oho, Kazuhiko Suzuki, Sadao Yamazaki
Microscopy (Oxford, England)|March 25, 2017
Support system for fine focusing and astigmatism correction using an auditory signal in scanning electron microscopyEisaku Oho, Kazuhiko Suzuki, Sadao Yamazaki
Scanning|December 6, 2021
Highly Reliable Method to Obtain a Correlation Coefficient Unaffected by the SEM Noise Component for Examining the Degree of Specimen Damage due to Electron Beam IrradiationEisaku Oho, Kazuhiko Suzuki, Sadao Yamazaki
Microscopy (Oxford, England)|June 19, 2014
A new field-of-view autotracking method for online tomography reconstruction based on back-projected ray image cross-correlationSachihiko Tomonaga, Misuzu Baba, Sadao Yamazaki, et al.
Pageof 1