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Scott D Findlay
Mark P Oxley
Leslie J Allen

Showing results (1-10 of 89) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 22, 2007
Modeling atomic-resolution scanning transmission electron microscopy imagesScott D Findlay, Mark P Oxley, Leslie J Allen
Ultramicroscopy|August 1, 2006
Three-dimensional ADF imaging of individual atoms by through-focal series scanning transmission electron microscopyKlaus van Benthem, Andrew R Lupini, Mark P Oxley, et al.
Nano Letters|October 16, 2010
Standardless atom counting in scanning transmission electron microscopyJames M LeBeau, Scott D Findlay, Leslie J Allen, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 16, 2020
Inelastic Scattering in Electron Backscatter Diffraction and Electron Channeling Contrast ImagingBudhika G Mendis, Juri Barthel, Scott D Findlay, et al.
Ultramicroscopy|November 27, 2009
Position averaged convergent beam electron diffraction: theory and applicationsJames M Lebeau, Scott D Findlay, Leslie J Allen, et al.
Physical Review Letters|June 4, 2008
Quantitative atomic resolution scanning transmission electron microscopyJames M LeBeau, Scott D Findlay, Leslie J Allen, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 25, 2014
Practical aspects of removing the effects of elastic and thermal diffuse scattering from spectroscopic data for single crystalsNathan R Lugg, Melissa J Neish, Scott D Findlay, et al.
Ultramicroscopy|August 7, 2017
Probing the effect of electron channelling on atomic resolution energy dispersive X-ray quantificationKatherine E MacArthur, Hamish G Brown, Scott D Findlay, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 27, 2021
Scattering Matrix Determination in Crystalline Materials from 4D Scanning Transmission Electron Microscopy at a Single Defocus ValueScott D Findlay, Hamish G Brown, Philipp M Pelz, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 12, 2021
Optimizing Experimental Conditions for Accurate Quantitative Energy-Dispersive X-ray Analysis of Interfaces at the Atomic ScaleKatherine E MacArthur, Andrew B Yankovich, Armand Béché, et al.
Pageof 9

Showing results (1-10 of 89) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 22, 2007
Modeling atomic-resolution scanning transmission electron microscopy imagesScott D Findlay, Mark P Oxley, Leslie J Allen
Ultramicroscopy|August 1, 2006
Three-dimensional ADF imaging of individual atoms by through-focal series scanning transmission electron microscopyKlaus van Benthem, Andrew R Lupini, Mark P Oxley, et al.
Nano Letters|October 16, 2010
Standardless atom counting in scanning transmission electron microscopyJames M LeBeau, Scott D Findlay, Leslie J Allen, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 16, 2020
Inelastic Scattering in Electron Backscatter Diffraction and Electron Channeling Contrast ImagingBudhika G Mendis, Juri Barthel, Scott D Findlay, et al.
Ultramicroscopy|November 27, 2009
Position averaged convergent beam electron diffraction: theory and applicationsJames M Lebeau, Scott D Findlay, Leslie J Allen, et al.
Physical Review Letters|June 4, 2008
Quantitative atomic resolution scanning transmission electron microscopyJames M LeBeau, Scott D Findlay, Leslie J Allen, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 25, 2014
Practical aspects of removing the effects of elastic and thermal diffuse scattering from spectroscopic data for single crystalsNathan R Lugg, Melissa J Neish, Scott D Findlay, et al.
Ultramicroscopy|August 7, 2017
Probing the effect of electron channelling on atomic resolution energy dispersive X-ray quantificationKatherine E MacArthur, Hamish G Brown, Scott D Findlay, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 27, 2021
Scattering Matrix Determination in Crystalline Materials from 4D Scanning Transmission Electron Microscopy at a Single Defocus ValueScott D Findlay, Hamish G Brown, Philipp M Pelz, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 12, 2021
Optimizing Experimental Conditions for Accurate Quantitative Energy-Dispersive X-ray Analysis of Interfaces at the Atomic ScaleKatherine E MacArthur, Andrew B Yankovich, Armand Béché, et al.
Pageof 9