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Ultramicroscopy|August 30, 2024
Differential phase contrast from electrons that cause inner shell ionizationMichael Deimetry, Timothy C Petersen, Hamish G Brown, et al.
Nano Letters|March 21, 2014
Three-dimensional location of a single dopant with atomic precision by aberration-corrected scanning transmission electron microscopyRyo Ishikawa, Andrew R Lupini, Scott D Findlay, et al.
Ultramicroscopy|August 7, 2017
Quantitative electric field mapping in thin specimens using a segmented detector: Revisiting the transfer function for differential phase contrastTakehito Seki, Gabriel Sánchez-Santolino, Ryo Ishikawa, et al.
ACS Nano|July 4, 2012
Direct imaging of dopant clustering in metal-oxide nanoparticlesMarta D Rossell, Quentin M Ramasse, Scott D Findlay, et al.
ACS Nano|May 30, 2013
Atomic-scale identification of individual lanthanide dopants in optical glass fiberTeruyasu Mizoguchi, Scott D Findlay, Atsunobu Masuno, et al.
Science Advances|June 13, 2025
Real-space observation of polarization induced charges at nanoscale ferroelectric interfacesMasaya Takamoto, Satoko Toyama, Takehito Seki, et al.
Small Science|April 11, 2025
Direct Imaging of Atomic Rattling Motion in a Clathrate CompoundKoudai Tabata, Takehito Seki, Scott D Findlay, et al.
Physical Review Letters|February 26, 2013
Functional complex point-defect structure in a huge-size-mismatch systemRyo Ishikawa, Naoya Shibata, Fumiyasu Oba, et al.
Nano Letters|October 28, 2010
Atomic structure of a CeO2 grain boundary: the role of oxygen vacanciesHajime Hojo, Teruyasu Mizoguchi, Hiromichi Ohta, et al.
Nature Communications|September 26, 2018
Direct electric field imaging of graphene defectsRyo Ishikawa, Scott D Findlay, Takehito Seki, et al.
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