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Scott D Findlay

Showing results (21-30 of 59) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 25, 2014
Practical aspects of removing the effects of elastic and thermal diffuse scattering from spectroscopic data for single crystalsNathan R Lugg, Melissa J Neish, Scott D Findlay, et al.
Ultramicroscopy|August 7, 2017
Probing the effect of electron channelling on atomic resolution energy dispersive X-ray quantificationKatherine E MacArthur, Hamish G Brown, Scott D Findlay, et al.
Plos One|April 19, 2016
A Digital PCR-Based Method for Efficient and Highly Specific Screening of Genome Edited CellsScott D Findlay, Krista M Vincent, Jennifer R Berman, et al.
Journal of Electron Microscopy|April 22, 2010
New area detector for atomic-resolution scanning transmission electron microscopyNaoya Shibata, Yuji Kohno, Scott D Findlay, et al.
Ultramicroscopy|August 30, 2024
Differential phase contrast from electrons that cause inner shell ionizationMichael Deimetry, Timothy C Petersen, Hamish G Brown, et al.
Nano Letters|March 21, 2014
Three-dimensional location of a single dopant with atomic precision by aberration-corrected scanning transmission electron microscopyRyo Ishikawa, Andrew R Lupini, Scott D Findlay, et al.
Ultramicroscopy|August 7, 2017
Quantitative electric field mapping in thin specimens using a segmented detector: Revisiting the transfer function for differential phase contrastTakehito Seki, Gabriel Sánchez-Santolino, Ryo Ishikawa, et al.
ACS Nano|July 4, 2012
Direct imaging of dopant clustering in metal-oxide nanoparticlesMarta D Rossell, Quentin M Ramasse, Scott D Findlay, et al.
ACS Nano|May 30, 2013
Atomic-scale identification of individual lanthanide dopants in optical glass fiberTeruyasu Mizoguchi, Scott D Findlay, Atsunobu Masuno, et al.
Science Advances|June 13, 2025
Real-space observation of polarization induced charges at nanoscale ferroelectric interfacesMasaya Takamoto, Satoko Toyama, Takehito Seki, et al.
Pageof 6

Showing results (21-30 of 59) with videos related to

Sort By:
Pageof 6
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 25, 2014
Practical aspects of removing the effects of elastic and thermal diffuse scattering from spectroscopic data for single crystalsNathan R Lugg, Melissa J Neish, Scott D Findlay, et al.
Ultramicroscopy|August 7, 2017
Probing the effect of electron channelling on atomic resolution energy dispersive X-ray quantificationKatherine E MacArthur, Hamish G Brown, Scott D Findlay, et al.
Plos One|April 19, 2016
A Digital PCR-Based Method for Efficient and Highly Specific Screening of Genome Edited CellsScott D Findlay, Krista M Vincent, Jennifer R Berman, et al.
Journal of Electron Microscopy|April 22, 2010
New area detector for atomic-resolution scanning transmission electron microscopyNaoya Shibata, Yuji Kohno, Scott D Findlay, et al.
Ultramicroscopy|August 30, 2024
Differential phase contrast from electrons that cause inner shell ionizationMichael Deimetry, Timothy C Petersen, Hamish G Brown, et al.
Nano Letters|March 21, 2014
Three-dimensional location of a single dopant with atomic precision by aberration-corrected scanning transmission electron microscopyRyo Ishikawa, Andrew R Lupini, Scott D Findlay, et al.
Ultramicroscopy|August 7, 2017
Quantitative electric field mapping in thin specimens using a segmented detector: Revisiting the transfer function for differential phase contrastTakehito Seki, Gabriel Sánchez-Santolino, Ryo Ishikawa, et al.
ACS Nano|July 4, 2012
Direct imaging of dopant clustering in metal-oxide nanoparticlesMarta D Rossell, Quentin M Ramasse, Scott D Findlay, et al.
ACS Nano|May 30, 2013
Atomic-scale identification of individual lanthanide dopants in optical glass fiberTeruyasu Mizoguchi, Scott D Findlay, Atsunobu Masuno, et al.
Science Advances|June 13, 2025
Real-space observation of polarization induced charges at nanoscale ferroelectric interfacesMasaya Takamoto, Satoko Toyama, Takehito Seki, et al.
Pageof 6