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Shiyuan Liu

Showing results (31-40 of 416) with videos related to

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Nanomaterials (Basel, Switzerland)|December 24, 2021
Optical Model and Optimization for Coherent-Incoherent Hybrid Organic Solar Cells with NanostructuresXuenan Zhao, Honggang Gu, Linya Chen, et al.
Applied Optics|June 4, 2019
In-line wavefront aberration adjustment of a projection lens for a lithographic tool using the dominant mode methodZhiyong Yang, Xiuguo Chen, Hao Jiang, et al.
Applied Optics|June 17, 2020
Fast reconstruction of the aberrated scanning lithographic image by a quadratic imaging model and an integral transfer functionZhiyong Yang, Xiuguo Chen, Hao Jiang, et al.
Biosensors & Bioelectronics|June 1, 2026
SELEX-derived potassium aptamers for robust detection in a physiological sodium backgroundQing Zhao, Kaijun Chen, Shiyuan Liu, et al.
Applied Optics|May 14, 2015
Calibration of misalignment errors in composite waveplates using Mueller matrix ellipsometryHonggang Gu, Shiyuan Liu, Xiuguo Chen, et al.
International Journal of Clinical and Experimental Pathology|January 2, 2016
A solitary pulmonary ground-glass nodule in adult systemic langerhans' cell histiocytosisYing Zhou, Yunyuan Li, Li Fan, et al.
Optics Express|April 8, 2010
Aerial image based technique for measurement of lens aberrations up to 37th Zernike coefficient in lithographic tools under partial coherent illuminationWei Liu, Shiyuan Liu, Tingting Zhou, et al.
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|November 4, 2009
Improved model-based infrared reflectrometry for measuring deep trench structuresChuanwei Zhang, Shiyuan Liu, Tielin Shi, et al.
Optics Express|June 21, 2012
Iterative method for in situ measurement of lens aberrations in lithographic tools using CTC-based quadratic aberration modelShiyuan Liu, Shuang Xu, Xiaofei Wu, et al.
Optics Letters|December 15, 2023
X-ray-based overlay metrology using reciprocal space slicing analysisJiahao Zhang, Xiuguo Chen, Tianjuan Yang, et al.
Pageof 42

Showing results (31-40 of 416) with videos related to

Sort By:
Pageof 42
Nanomaterials (Basel, Switzerland)|December 24, 2021
Optical Model and Optimization for Coherent-Incoherent Hybrid Organic Solar Cells with NanostructuresXuenan Zhao, Honggang Gu, Linya Chen, et al.
Applied Optics|June 4, 2019
In-line wavefront aberration adjustment of a projection lens for a lithographic tool using the dominant mode methodZhiyong Yang, Xiuguo Chen, Hao Jiang, et al.
Applied Optics|June 17, 2020
Fast reconstruction of the aberrated scanning lithographic image by a quadratic imaging model and an integral transfer functionZhiyong Yang, Xiuguo Chen, Hao Jiang, et al.
Biosensors & Bioelectronics|June 1, 2026
SELEX-derived potassium aptamers for robust detection in a physiological sodium backgroundQing Zhao, Kaijun Chen, Shiyuan Liu, et al.
Applied Optics|May 14, 2015
Calibration of misalignment errors in composite waveplates using Mueller matrix ellipsometryHonggang Gu, Shiyuan Liu, Xiuguo Chen, et al.
International Journal of Clinical and Experimental Pathology|January 2, 2016
A solitary pulmonary ground-glass nodule in adult systemic langerhans' cell histiocytosisYing Zhou, Yunyuan Li, Li Fan, et al.
Optics Express|April 8, 2010
Aerial image based technique for measurement of lens aberrations up to 37th Zernike coefficient in lithographic tools under partial coherent illuminationWei Liu, Shiyuan Liu, Tingting Zhou, et al.
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|November 4, 2009
Improved model-based infrared reflectrometry for measuring deep trench structuresChuanwei Zhang, Shiyuan Liu, Tielin Shi, et al.
Optics Express|June 21, 2012
Iterative method for in situ measurement of lens aberrations in lithographic tools using CTC-based quadratic aberration modelShiyuan Liu, Shuang Xu, Xiaofei Wu, et al.
Optics Letters|December 15, 2023
X-ray-based overlay metrology using reciprocal space slicing analysisJiahao Zhang, Xiuguo Chen, Tianjuan Yang, et al.
Pageof 42