Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Soon Fatt Yoon

Showing results (1-10 of 25) with videos related to

Pageof 3
Sort By:
Nanoscale Research Letters|September 26, 2012
Large size self-assembled quantum rings: quantum size effect and modulation on the surface diffusionCunzhu Tong, Soon Fatt Yoon, Lijun Wang
Nanoscale Research Letters|June 30, 2011
Improved ground-state modulation characteristics in 1.3 μm InAs/GaAs quantum dot lasers by rapid thermal annealingHanxue Zhao, Soon Fatt Yoon, Chun Yong Ngo, et al.
Optics Express|August 19, 2009
White-light scanning interferometer for absolute nano-scale gap thickness measurementZhiguang Xu, Vijay Shilpiekandula, Kamal Youcef-toumi, et al.
Journal of Biomedical Optics|July 5, 2011
Feasibility study on bonding quality inspection of microfluidic devices by optical coherence tomographyShiguang Li, Zhiguang Xu, Soon Fatt Yoon, et al.
Nanoscale Research Letters|February 8, 2013
Effects of annealing on performances of 1.3-μm InAs-InGaAs-GaAs quantum dot electroabsorption modulatorsShuh Ying Lee, Soon Fatt Yoon, Andrew Cy Ngo, et al.
Nanotechnology|April 20, 2010
Gallium arsenide (GaAs) island growth under SiO(2) nanodisks patterned on GaAs substratesLiliana Tjahjana, Benzhong Wang, Hendrix Tanoto, et al.
Applied Optics|November 26, 2009
Measurement of buried undercut structures in microfluidic devices by laser fluorescent confocal microscopyShiguang Li, Jing Liu, Nam-Trung Nguyen, et al.
Optics Express|June 11, 2008
Three dimensional sidewall measurements by laser fluorescent confocal microscopyShiguang Li, Zhiguang Xu, Ivan Reading, et al.
Optics Express|April 8, 2010
Large-area and high-resolution distortion measurement based on Moiré fringe method for hot embossing processZhiguang Xu, Hayden K Taylor, Duane S Boning, et al.
Applied Optics|September 22, 2009
Microvalve thickness and topography measurements in microfluidic devices by white-light confocal microscopyShiguang Li, Todd Thorsen, Zhiguang Xu, et al.
Pageof 3

Showing results (1-10 of 25) with videos related to

Sort By:
Pageof 3
Nanoscale Research Letters|September 26, 2012
Large size self-assembled quantum rings: quantum size effect and modulation on the surface diffusionCunzhu Tong, Soon Fatt Yoon, Lijun Wang
Nanoscale Research Letters|June 30, 2011
Improved ground-state modulation characteristics in 1.3 μm InAs/GaAs quantum dot lasers by rapid thermal annealingHanxue Zhao, Soon Fatt Yoon, Chun Yong Ngo, et al.
Optics Express|August 19, 2009
White-light scanning interferometer for absolute nano-scale gap thickness measurementZhiguang Xu, Vijay Shilpiekandula, Kamal Youcef-toumi, et al.
Journal of Biomedical Optics|July 5, 2011
Feasibility study on bonding quality inspection of microfluidic devices by optical coherence tomographyShiguang Li, Zhiguang Xu, Soon Fatt Yoon, et al.
Nanoscale Research Letters|February 8, 2013
Effects of annealing on performances of 1.3-μm InAs-InGaAs-GaAs quantum dot electroabsorption modulatorsShuh Ying Lee, Soon Fatt Yoon, Andrew Cy Ngo, et al.
Nanotechnology|April 20, 2010
Gallium arsenide (GaAs) island growth under SiO(2) nanodisks patterned on GaAs substratesLiliana Tjahjana, Benzhong Wang, Hendrix Tanoto, et al.
Applied Optics|November 26, 2009
Measurement of buried undercut structures in microfluidic devices by laser fluorescent confocal microscopyShiguang Li, Jing Liu, Nam-Trung Nguyen, et al.
Optics Express|June 11, 2008
Three dimensional sidewall measurements by laser fluorescent confocal microscopyShiguang Li, Zhiguang Xu, Ivan Reading, et al.
Optics Express|April 8, 2010
Large-area and high-resolution distortion measurement based on Moiré fringe method for hot embossing processZhiguang Xu, Hayden K Taylor, Duane S Boning, et al.
Applied Optics|September 22, 2009
Microvalve thickness and topography measurements in microfluidic devices by white-light confocal microscopyShiguang Li, Todd Thorsen, Zhiguang Xu, et al.
Pageof 3