Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Stuart I Wright
Saransh Singh
Marc De Graef

Showing results (1-10 of 49) with videos related to

Pageof 5
Sort By:
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 28, 2019
Reflector Selection for the Indexing of Electron Backscatter Diffraction PatternsStuart I Wright, Saransh Singh, Marc De Graef
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 7, 2017
Dictionary Indexing of Electron Channeling PatternsSaransh Singh, Marc De Graef
Ultramicroscopy|October 8, 2020
Scanning transmission electron microscopy image simulations of complex dislocation structures generated by discrete dislocation dynamicsJoseph Tessmer, Saransh Singh, Yejun Gu, et al.
Ultramicroscopy|February 12, 2018
Energy-weighted dynamical scattering simulations of electron diffraction modalities in the scanning electron microscopeElena Pascal, Saransh Singh, Patrick G Callahan, et al.
Scientific Reports|July 22, 2018
High resolution low kV EBSD of heavily deformed and nanocrystalline Aluminium by dictionary-based indexingSaransh Singh, Yi Guo, Bartłomiej Winiarski, et al.
Ultramicroscopy|April 16, 2018
Corrigendum to "Energy-weighted dynamical scattering simulations of electron diffraction modalities in the scanning electron microscope" Ultramicroscopy 187 (2018) 98-106Elena Pascal, Saransh Singh, Patrick G Callahan, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 19, 2018
Extracting Grain Orientations from EBSD Patterns of Polycrystalline Materials Using Convolutional Neural NetworksDipendra Jha, Saransh Singh, Reda Al-Bahrani, et al.
Ultramicroscopy|September 7, 2015
Introduction and comparison of new EBSD post-processing methodologiesStuart I Wright, Matthew M Nowell, Scott P Lindeman, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 11, 2016
Performance of Dynamically Simulated Reference Patterns for Cross-Correlation Electron Backscatter DiffractionBrian E Jackson, Jordan J Christensen, Saransh Singh, et al.
Journal of Applied Crystallography|June 7, 2024
Applications of the Clifford torus to material texturesMarc De Graef
Pageof 5

Showing results (1-10 of 49) with videos related to

Sort By:
Pageof 5
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 28, 2019
Reflector Selection for the Indexing of Electron Backscatter Diffraction PatternsStuart I Wright, Saransh Singh, Marc De Graef
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 7, 2017
Dictionary Indexing of Electron Channeling PatternsSaransh Singh, Marc De Graef
Ultramicroscopy|October 8, 2020
Scanning transmission electron microscopy image simulations of complex dislocation structures generated by discrete dislocation dynamicsJoseph Tessmer, Saransh Singh, Yejun Gu, et al.
Ultramicroscopy|February 12, 2018
Energy-weighted dynamical scattering simulations of electron diffraction modalities in the scanning electron microscopeElena Pascal, Saransh Singh, Patrick G Callahan, et al.
Scientific Reports|July 22, 2018
High resolution low kV EBSD of heavily deformed and nanocrystalline Aluminium by dictionary-based indexingSaransh Singh, Yi Guo, Bartłomiej Winiarski, et al.
Ultramicroscopy|April 16, 2018
Corrigendum to "Energy-weighted dynamical scattering simulations of electron diffraction modalities in the scanning electron microscope" Ultramicroscopy 187 (2018) 98-106Elena Pascal, Saransh Singh, Patrick G Callahan, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 19, 2018
Extracting Grain Orientations from EBSD Patterns of Polycrystalline Materials Using Convolutional Neural NetworksDipendra Jha, Saransh Singh, Reda Al-Bahrani, et al.
Ultramicroscopy|September 7, 2015
Introduction and comparison of new EBSD post-processing methodologiesStuart I Wright, Matthew M Nowell, Scott P Lindeman, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 11, 2016
Performance of Dynamically Simulated Reference Patterns for Cross-Correlation Electron Backscatter DiffractionBrian E Jackson, Jordan J Christensen, Saransh Singh, et al.
Journal of Applied Crystallography|June 7, 2024
Applications of the Clifford torus to material texturesMarc De Graef
Pageof 5