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Tanishiro

Showing results (1-10 of 14) with videos related to

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Physical Review. B, Condensed Matter|July 15, 1986
Dimer-chain model for the 7 x 7 and the 2 x 8 reconstructed surfaces of reconstructed surfaces of Si(111) and Ge(111)Takayanagi, Tanishiro
Physical Review. B, Condensed Matter|October 15, 1990
Commensurate reconstruction on a (001) facet of a gold particleMitome, Takayanagi, Tanishiro
Physical Review Letters|January 1, 1996
Dynamical step edge stiffness on the Si(111) surfaceLatyshev, Minoda, Tanishiro, et al.
ASAIO Journal (American Society for Artificial Internal Organs : 1992)|August 17, 2004
Arterial sound based noninvasive malrotation detection of rotary LVADHiroyuki Tanishiro, Akio Funakubo, Yasuhiro Fukui
Ultramicroscopy|September 1, 2012
Study on probe current dependence of the intensity distribution in annular dark field imagesSuhyun Kim, Yoshifumi Oshima, Yasumasa Tanishiro, et al.
Ultramicroscopy|September 8, 2012
Element discrimination in a hexagonal boron nitride nanosheet by aberration corrected transmission electron microscopyMasanori Mitome, Hidetaka Sawada, Yukihito Kondo, et al.
Ultramicroscopy|August 6, 2013
Determination of aberration center of Ronchigram for automated aberration correctors in scanning transmission electron microscopyTakumi Sannomiya, Hidetaka Sawada, Tomohiro Nakamichi, et al.
Journal of Electron Microscopy|June 24, 2009
STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gunHidetaka Sawada, Yasumasa Tanishiro, Nobuhiro Ohashi, et al.
Journal of Electron Microscopy|January 21, 2011
Quantitative annular dark-field STEM images of a silicon crystal using a large-angle convergent electron probe with a 300-kV cold field-emission gunSuhyun Kim, Yoshifumi Oshima, Hidetaka Sawada, et al.
Journal of Electron Microscopy|August 17, 2011
Electron microscopy at a sub-50 pm resolutionK Takayanagi, S Kim, S Lee, et al.
Pageof 2

Showing results (1-10 of 14) with videos related to

Sort By:
Pageof 2
Physical Review. B, Condensed Matter|July 15, 1986
Dimer-chain model for the 7 x 7 and the 2 x 8 reconstructed surfaces of reconstructed surfaces of Si(111) and Ge(111)Takayanagi, Tanishiro
Physical Review. B, Condensed Matter|October 15, 1990
Commensurate reconstruction on a (001) facet of a gold particleMitome, Takayanagi, Tanishiro
Physical Review Letters|January 1, 1996
Dynamical step edge stiffness on the Si(111) surfaceLatyshev, Minoda, Tanishiro, et al.
ASAIO Journal (American Society for Artificial Internal Organs : 1992)|August 17, 2004
Arterial sound based noninvasive malrotation detection of rotary LVADHiroyuki Tanishiro, Akio Funakubo, Yasuhiro Fukui
Ultramicroscopy|September 1, 2012
Study on probe current dependence of the intensity distribution in annular dark field imagesSuhyun Kim, Yoshifumi Oshima, Yasumasa Tanishiro, et al.
Ultramicroscopy|September 8, 2012
Element discrimination in a hexagonal boron nitride nanosheet by aberration corrected transmission electron microscopyMasanori Mitome, Hidetaka Sawada, Yukihito Kondo, et al.
Ultramicroscopy|August 6, 2013
Determination of aberration center of Ronchigram for automated aberration correctors in scanning transmission electron microscopyTakumi Sannomiya, Hidetaka Sawada, Tomohiro Nakamichi, et al.
Journal of Electron Microscopy|June 24, 2009
STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gunHidetaka Sawada, Yasumasa Tanishiro, Nobuhiro Ohashi, et al.
Journal of Electron Microscopy|January 21, 2011
Quantitative annular dark-field STEM images of a silicon crystal using a large-angle convergent electron probe with a 300-kV cold field-emission gunSuhyun Kim, Yoshifumi Oshima, Hidetaka Sawada, et al.
Journal of Electron Microscopy|August 17, 2011
Electron microscopy at a sub-50 pm resolutionK Takayanagi, S Kim, S Lee, et al.
Pageof 2