Search research articles
Contact Us
Filters
Showing results (1-10 of 73) with videos related to
Page
of 8
Sort By:
Nanotechnology
|
May 10, 2019
Nanoscale resistive switching memory devices: a review
Stefan Slesazeck, Thomas Mikolajick
Reports on Progress in Physics. Physical Society (Great Britain)
|
January 6, 2017
Silicon and germanium nanowire electronics: physics of conventional and unconventional transistors
Walter M Weber, Thomas Mikolajick
ACS Applied Materials & Interfaces
|
June 28, 2018
Accumulative Polarization Reversal in Nanoscale Ferroelectric Transistors
Halid Mulaosmanovic, Thomas Mikolajick, Stefan Slesazeck
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
|
March 14, 2015
Dynamic leakage current compensation revisited
Tony Schenk, Uwe Schroeder, Thomas Mikolajick
ACS Applied Electronic Materials
|
June 16, 2025
Effect of HZO Thickness Scaling in the Bilayer Ferroelectric Tunnel Junction
Luca Carpentieri, Thomas Mikolajick, Stefan Slesazeck
Materials (Basel, Switzerland)
|
February 15, 2022
Status of Aluminum Oxide Gate Dielectric Technology for Insulated-Gate GaN-Based Devices
Anthony Calzolaro, Thomas Mikolajick, Andre Wachowiak
Nano Letters
|
July 31, 2023
Role of Defects in the Breakdown Phenomenon of Al<sub>1-</sub>Sc<sub></sub>N: From Ferroelectric to Filamentary Resistive Switching
Roberto Guido, Thomas Mikolajick, Uwe Schroeder, et al.
ACS Applied Materials & Interfaces
|
May 2, 2025
ZrO<sub>2</sub> Based Multilayered Stacks with Al<sub>2</sub>O<sub>3</sub>, Y<sub>2</sub>O<sub>3</sub> or La<sub>2</sub>O<sub>3</sub> Interlayers for SiC Power Devices
Sandra Krause, Aleksey Mikhaylov, Uwe Schroeder, et al.
Advanced Materials (Deerfield Beach, Fla.)
|
August 26, 2022
From Ferroelectric Material Optimization to Neuromorphic Devices
Thomas Mikolajick, Min Hyuk Park, Laura Begon-Lours, et al.
ACS Applied Materials & Interfaces
|
December 1, 2015
On the Control of the Fixed Charge Densities in Al2O3-Based Silicon Surface Passivation Schemes
Daniel K Simon, Paul M Jordan, Thomas Mikolajick, et al.
Page
of 8
Search research articles
Search
Showing results (1-10 of 73) with videos related to
Sort By:
Page
of 8
Nanotechnology
|
May 10, 2019
Nanoscale resistive switching memory devices: a review
Stefan Slesazeck, Thomas Mikolajick
Reports on Progress in Physics. Physical Society (Great Britain)
|
January 6, 2017
Silicon and germanium nanowire electronics: physics of conventional and unconventional transistors
Walter M Weber, Thomas Mikolajick
ACS Applied Materials & Interfaces
|
June 28, 2018
Accumulative Polarization Reversal in Nanoscale Ferroelectric Transistors
Halid Mulaosmanovic, Thomas Mikolajick, Stefan Slesazeck
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
|
March 14, 2015
Dynamic leakage current compensation revisited
Tony Schenk, Uwe Schroeder, Thomas Mikolajick
ACS Applied Electronic Materials
|
June 16, 2025
Effect of HZO Thickness Scaling in the Bilayer Ferroelectric Tunnel Junction
Luca Carpentieri, Thomas Mikolajick, Stefan Slesazeck
Materials (Basel, Switzerland)
|
February 15, 2022
Status of Aluminum Oxide Gate Dielectric Technology for Insulated-Gate GaN-Based Devices
Anthony Calzolaro, Thomas Mikolajick, Andre Wachowiak
Nano Letters
|
July 31, 2023
Role of Defects in the Breakdown Phenomenon of Al<sub>1-</sub>Sc<sub></sub>N: From Ferroelectric to Filamentary Resistive Switching
Roberto Guido, Thomas Mikolajick, Uwe Schroeder, et al.
ACS Applied Materials & Interfaces
|
May 2, 2025
ZrO<sub>2</sub> Based Multilayered Stacks with Al<sub>2</sub>O<sub>3</sub>, Y<sub>2</sub>O<sub>3</sub> or La<sub>2</sub>O<sub>3</sub> Interlayers for SiC Power Devices
Sandra Krause, Aleksey Mikhaylov, Uwe Schroeder, et al.
Advanced Materials (Deerfield Beach, Fla.)
|
August 26, 2022
From Ferroelectric Material Optimization to Neuromorphic Devices
Thomas Mikolajick, Min Hyuk Park, Laura Begon-Lours, et al.
ACS Applied Materials & Interfaces
|
December 1, 2015
On the Control of the Fixed Charge Densities in Al2O3-Based Silicon Surface Passivation Schemes
Daniel K Simon, Paul M Jordan, Thomas Mikolajick, et al.
Page
of 8