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Thorsten Mehrtens

Showing results (1-10 of 18) with videos related to

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Micron (Oxford, England : 1993)|April 6, 2012
Optimization of the preparation of GaN-based specimens with low-energy ion milling for (S)TEMThorsten Mehrtens, Stephanie Bley, Parlapalli Venkata Satyam, et al.
Physical Review Letters|September 13, 2014
Conventional transmission electron microscopy imaging beyond the diffraction and information limitsAndreas Rosenauer, Florian F Krause, Knut Müller, et al.
Ultramicroscopy|May 14, 2013
Measurement of indium concentration profiles and segregation efficiencies from high-angle annular dark field-scanning transmission electron microscopy imagesThorsten Mehrtens, Knut Müller, Marco Schowalter, et al.
Ultramicroscopy|April 17, 2018
Using molecular dynamics for multislice TEM simulation of thermal diffuse scattering in AlGaNFlorian F Krause, Dennis Bredemeier, Marco Schowalter, et al.
Ultramicroscopy|December 22, 2015
Effects of instrument imperfections on quantitative scanning transmission electron microscopyFlorian F Krause, Marco Schowalter, Tim Grieb, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 25, 2014
Quantitative strain and compositional studies of InxGa1-xAs Epilayer in a GaAs-based pHEMT device structure by TEM techniquesDuggi V Sridhara Rao, Ramachandran Sankarasubramanian, Kuttanellore Muraleedharan, et al.
Ultramicroscopy|May 28, 2021
Accuracy and precision of position determination in ISTEM imaging of BaTiO<sub>3</sub>Dennis Marquardt, Marco Schowalter, Florian F Krause, et al.
Ultramicroscopy|December 18, 2022
Dose efficient annular bright field contrast with the ISTEM method: A proof of principle demonstrationFlorian F Krause, Marco Schowalter, Beeke Gerken, et al.
Journal of Microscopy|February 19, 2024
GaN atomic electric fields from a segmented STEM detector: Experiment and simulationTim Grieb, Florian F Krause, Thorsten Mehrtens, et al.
Ultramicroscopy|July 5, 2015
Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffractionChristoph Mahr, Knut Müller-Caspary, Tim Grieb, et al.
Pageof 2

Showing results (1-10 of 18) with videos related to

Sort By:
Pageof 2
Micron (Oxford, England : 1993)|April 6, 2012
Optimization of the preparation of GaN-based specimens with low-energy ion milling for (S)TEMThorsten Mehrtens, Stephanie Bley, Parlapalli Venkata Satyam, et al.
Physical Review Letters|September 13, 2014
Conventional transmission electron microscopy imaging beyond the diffraction and information limitsAndreas Rosenauer, Florian F Krause, Knut Müller, et al.
Ultramicroscopy|May 14, 2013
Measurement of indium concentration profiles and segregation efficiencies from high-angle annular dark field-scanning transmission electron microscopy imagesThorsten Mehrtens, Knut Müller, Marco Schowalter, et al.
Ultramicroscopy|April 17, 2018
Using molecular dynamics for multislice TEM simulation of thermal diffuse scattering in AlGaNFlorian F Krause, Dennis Bredemeier, Marco Schowalter, et al.
Ultramicroscopy|December 22, 2015
Effects of instrument imperfections on quantitative scanning transmission electron microscopyFlorian F Krause, Marco Schowalter, Tim Grieb, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 25, 2014
Quantitative strain and compositional studies of InxGa1-xAs Epilayer in a GaAs-based pHEMT device structure by TEM techniquesDuggi V Sridhara Rao, Ramachandran Sankarasubramanian, Kuttanellore Muraleedharan, et al.
Ultramicroscopy|May 28, 2021
Accuracy and precision of position determination in ISTEM imaging of BaTiO<sub>3</sub>Dennis Marquardt, Marco Schowalter, Florian F Krause, et al.
Ultramicroscopy|December 18, 2022
Dose efficient annular bright field contrast with the ISTEM method: A proof of principle demonstrationFlorian F Krause, Marco Schowalter, Beeke Gerken, et al.
Journal of Microscopy|February 19, 2024
GaN atomic electric fields from a segmented STEM detector: Experiment and simulationTim Grieb, Florian F Krause, Thorsten Mehrtens, et al.
Ultramicroscopy|July 5, 2015
Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffractionChristoph Mahr, Knut Müller-Caspary, Tim Grieb, et al.
Pageof 2