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Tiarnan Mullarkey

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 18, 2020
Development of a Practicable Digital Pulse Read-Out for Dark-Field STEMTiarnan Mullarkey, Clive Downing, Lewys Jones
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 25, 2023
Interlacing in Atomic Resolution Scanning Transmission Electron MicroscopyJonathan J P Peters, Tiarnan Mullarkey, James A Gott, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 25, 2023
How Fast is Your Detector? The Effect of Temporal Response on Image QualityTiarnan Mullarkey, Matthew Geever, Jonathan J P Peters, et al.
Ultramicroscopy|September 28, 2024
On the temporal transfer function in STEM imaging from finite detector response timeJonathan J P Peters, Tiarnan Mullarkey, Julie Marie Bekkevold, et al.
Nature Communications|August 25, 2023
Electron counting detectors in scanning transmission electron microscopy via hardware signal processingJonathan J P Peters, Tiarnan Mullarkey, Emma Hedley, et al.
Ultramicroscopy|June 17, 2024
New Poisson denoising method for pulse-count STEM imagingTaichi Kusumi, Shun Katakami, Ryo Ishikawa, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 18, 2020
Development of a Practicable Digital Pulse Read-Out for Dark-Field STEMTiarnan Mullarkey, Clive Downing, Lewys Jones
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 25, 2023
Interlacing in Atomic Resolution Scanning Transmission Electron MicroscopyJonathan J P Peters, Tiarnan Mullarkey, James A Gott, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 25, 2023
How Fast is Your Detector? The Effect of Temporal Response on Image QualityTiarnan Mullarkey, Matthew Geever, Jonathan J P Peters, et al.
Ultramicroscopy|September 28, 2024
On the temporal transfer function in STEM imaging from finite detector response timeJonathan J P Peters, Tiarnan Mullarkey, Julie Marie Bekkevold, et al.
Nature Communications|August 25, 2023
Electron counting detectors in scanning transmission electron microscopy via hardware signal processingJonathan J P Peters, Tiarnan Mullarkey, Emma Hedley, et al.
Ultramicroscopy|June 17, 2024
New Poisson denoising method for pulse-count STEM imagingTaichi Kusumi, Shun Katakami, Ryo Ishikawa, et al.
Pageof 1