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Ultramicroscopy|April 16, 2010
Optimization of EFTEM image acquisition by using elastically filtered images for drift correctionTobias Heil, Helmut KohlUltramicroscopy|February 10, 2009
Quantitative comparison of energy-filtering transmission electron microscopy and atom probe tomographyPatrick Stender, Tobias Heil, Helmut Kohl, et al.Ultramicroscopy|June 26, 2012
Improving the reliability of the background extrapolation in transmission electron microscopy elemental maps by using three pre-edge windowsTobias Heil, Benedikt Gralla, Michael Epping, et al.Nano Letters|May 9, 2009
Experimental evidence of self-limited growth of nanocrystals in glassSomnath Bhattacharyya, Christian Bocker, Tobias Heil, et al.Ultramicroscopy|January 19, 2023
Optimized detector configurations for the reconstruction of phase-contrast images in scanning transmission electron microscopyAlex Oster, Helmut KohlUltramicroscopy|December 16, 2014
Calculation of inelastic scattering processes of relativistic electrons in oriented crystalsDieter Hinderks, Helmut KohlMicroscopy (Oxford, England)|February 16, 2018
Noise reduction in CCD measurements by improving the quality of dark-reference imagesTobias Heil, Gordon J TatlockMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 1, 2022
Quantitative Strain and Topography Mapping of 2D Materials Using Nanobeam Electron DiffractionJulian Sickel, Marcel Asbach, Christoph Gammer, et al.Chemsuschem|October 22, 2020
Guanine-Derived Porous Carbonaceous Materials: Towards C1 N1Janina Kossmann, Tobias Heil, Markus Antonietti, et al.ACS Applied Materials & Interfaces|October 15, 2024
Unlocking Unexpected Charge Transfer Pathways in Interconnected NanostructuresKenan Elibol, Marko Burghard, Tobias Heil, et al.Pageof 5