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Tobias Herffurth

Showing results (1-10 of 7) with videos related to

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Applied Optics|April 5, 2011
Angle-resolved scattering: an effective method for characterizing thin-film coatingsSven Schröder, Tobias Herffurth, Holger Blaschke, et al.
Applied Optics|March 20, 2010
Angle-resolved scattering and reflectance of extreme-ultraviolet multilayer coatings: measurement and analysisSven Schröder, Tobias Herffurth, Marcus Trost, et al.
Applied Optics|February 12, 2014
Scattering reduction through oblique multilayer depositionMarcus Trost, Tobias Herffurth, Sven Schröder, et al.
Applied Optics|May 15, 2013
Comprehensive nanostructure and defect analysis using a simple 3D light-scatter sensorTobias Herffurth, Sven Schröder, Marcus Trost, et al.
Applied Optics|February 12, 2014
Characterization of optical coatings using a multisource table-top scatterometerAlexander von Finck, Tobias Herffurth, Sven Schröder, et al.
Applied Optics|October 3, 2013
Evaluation of subsurface damage by light scattering techniquesMarcus Trost, Tobias Herffurth, David Schmitz, et al.
Applied Optics|March 17, 2026
Optical losses in SiN<sub>x</sub> and SiO<sub>x</sub>N<sub>y</sub> coatings deposited by plasma-enhanced chemical vapor deposition for gravitational wave detectorsKirstin Saunders, Tobias Herffurth, Simon Bublitz, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Applied Optics|April 5, 2011
Angle-resolved scattering: an effective method for characterizing thin-film coatingsSven Schröder, Tobias Herffurth, Holger Blaschke, et al.
Applied Optics|March 20, 2010
Angle-resolved scattering and reflectance of extreme-ultraviolet multilayer coatings: measurement and analysisSven Schröder, Tobias Herffurth, Marcus Trost, et al.
Applied Optics|February 12, 2014
Scattering reduction through oblique multilayer depositionMarcus Trost, Tobias Herffurth, Sven Schröder, et al.
Applied Optics|May 15, 2013
Comprehensive nanostructure and defect analysis using a simple 3D light-scatter sensorTobias Herffurth, Sven Schröder, Marcus Trost, et al.
Applied Optics|February 12, 2014
Characterization of optical coatings using a multisource table-top scatterometerAlexander von Finck, Tobias Herffurth, Sven Schröder, et al.
Applied Optics|October 3, 2013
Evaluation of subsurface damage by light scattering techniquesMarcus Trost, Tobias Herffurth, David Schmitz, et al.
Applied Optics|March 17, 2026
Optical losses in SiN<sub>x</sub> and SiO<sub>x</sub>N<sub>y</sub> coatings deposited by plasma-enhanced chemical vapor deposition for gravitational wave detectorsKirstin Saunders, Tobias Herffurth, Simon Bublitz, et al.
Pageof 1