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Ultramicroscopy|August 12, 2017
Subsampling and inpainting approaches for electron tomographyToby Sanders, Christian DwyerIEEE Transactions on Image Processing : a Publication of the IEEE Signal Processing Society|July 24, 2019
Inpainting vs denoising for dose reduction in scanning-beam microscopiesToby Sanders, Christian DwyerMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 17, 2017
Improved Three-Dimensional (3D) Resolution of Electron Tomograms Using Robust Mathematical Data-Processing TechniquesToby Sanders, Ilke ArslanAdvanced Structural and Chemical Imaging|November 13, 2018
Multiscale higher-order TV operators for L1 regularizationToby Sanders, Rodrigo B PlattePhysical Review Letters|February 17, 2023
Quantum Limits of Transmission Electron MicroscopyChristian DwyerMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 14, 2014
Quantitative position-averaged K-, L-, and M-shell core-loss scattering in STEMYe Zhu, Christian DwyerUltramicroscopy|January 9, 2017
Recovering fine details from under-resolved electron tomography data using higher order total variation ℓ<sub>1</sub> regularizationToby Sanders, Anne Gelb, Rodrigo B Platte, et al.Physics in Medicine and Biology|November 6, 2025
Multi-harmonic gridded 3D deconvolution (MH3D) for robust and accurate image reconstruction in MPI for single axis drive field scannersToby Sanders, Justin J Konkle, Erica E Mason, et al.Scientific Reports|September 28, 2017
Electron tomography and fractal aspects of MoS<sub>2</sub> and MoS<sub>2</sub>/Co spheresManuel Ramos, Félix Galindo-Hernández, Ilke Arslan, et al.Ultramicroscopy|February 25, 2014
Is there a Stobbs factor in atomic-resolution STEM-EELS mapping?Huolin L Xin, Christian Dwyer, David A MullerPageof 5