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Todd C Schwendemann

Showing results (1-10 of 8) with videos related to

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Advanced Materials (Deerfield Beach, Fla.)|April 10, 2010
Three-dimensional atomic force microscopy - taking surface imaging to the next levelMehmet Z Baykara, Todd C Schwendemann, Eric I Altman, et al.
Beilstein Journal of Nanotechnology|September 29, 2012
Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reductionMehmet Z Baykara, Omur E Dagdeviren, Todd C Schwendemann, et al.
Nanotechnology|June 11, 2009
Data acquisition and analysis procedures for high-resolution atomic force microscopy in three dimensionsBoris J Albers, Todd C Schwendemann, Mehmet Z Baykara, et al.
Nature Nanotechnology|May 8, 2009
Three-dimensional imaging of short-range chemical forces with picometre resolutionBoris J Albers, Todd C Schwendemann, Mehmet Z Baykara, et al.
Nanotechnology|September 22, 2012
Exploring atomic-scale lateral forces in the attractive regime: a case study on graphite (0001)Mehmet Z Baykara, Todd C Schwendemann, Boris J Albers, et al.
ACS Nano|October 12, 2013
Understanding scanning tunneling microscopy contrast mechanisms on metal oxides: a case studyHarry Mönig, Milica Todorović, Mehmet Z Baykara, et al.
Advanced Materials (Deerfield Beach, Fla.)|April 24, 2010
Achieving A-site termination on La(0.18)Sr(0.82)Al(0.59)Ta(0.41)O(3) substratesJoseph H Ngai, Todd C Schwendemann, Anna E Walker, et al.
The Review of Scientific Instruments|April 2, 2008
Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopyBoris J Albers, Marcus Liebmann, Todd C Schwendemann, et al.
Pageof 1

Showing results (1-10 of 8) with videos related to

Sort By:
Pageof 1
Advanced Materials (Deerfield Beach, Fla.)|April 10, 2010
Three-dimensional atomic force microscopy - taking surface imaging to the next levelMehmet Z Baykara, Todd C Schwendemann, Eric I Altman, et al.
Beilstein Journal of Nanotechnology|September 29, 2012
Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reductionMehmet Z Baykara, Omur E Dagdeviren, Todd C Schwendemann, et al.
Nanotechnology|June 11, 2009
Data acquisition and analysis procedures for high-resolution atomic force microscopy in three dimensionsBoris J Albers, Todd C Schwendemann, Mehmet Z Baykara, et al.
Nature Nanotechnology|May 8, 2009
Three-dimensional imaging of short-range chemical forces with picometre resolutionBoris J Albers, Todd C Schwendemann, Mehmet Z Baykara, et al.
Nanotechnology|September 22, 2012
Exploring atomic-scale lateral forces in the attractive regime: a case study on graphite (0001)Mehmet Z Baykara, Todd C Schwendemann, Boris J Albers, et al.
ACS Nano|October 12, 2013
Understanding scanning tunneling microscopy contrast mechanisms on metal oxides: a case studyHarry Mönig, Milica Todorović, Mehmet Z Baykara, et al.
Advanced Materials (Deerfield Beach, Fla.)|April 24, 2010
Achieving A-site termination on La(0.18)Sr(0.82)Al(0.59)Ta(0.41)O(3) substratesJoseph H Ngai, Todd C Schwendemann, Anna E Walker, et al.
The Review of Scientific Instruments|April 2, 2008
Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopyBoris J Albers, Marcus Liebmann, Todd C Schwendemann, et al.
Pageof 1