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Tomoe Fukamachi

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Acta Crystallographica. Section A, Foundations and Advances|September 1, 2022
Origin of irregular X-ray mirage fringes from a bent, thin crystalTomoe Fukamachi, Takaaki Kawamura
Acta Crystallographica. Section A, Foundations of Crystallography|October 26, 2005
Anomalous scattering factor determined by semicircle fitting near the K-absorption edge of GeMasami Yoshizawa, Shengming Zhou, Riichirou Negishi, et al.
Acta Crystallographica. Section A, Foundations of Crystallography|October 22, 2002
Extinction effect and Borrmann effect of resonant dynamical scattering in the Bragg caseTomoe Fukamachi, Riichirou Negishi, ShengMing Zhou, et al.
Acta Crystallographica. Section A, Foundations of Crystallography|February 21, 2008
Precise determination of anomalous scattering factors of Ge by using X-ray resonant scatteringMasami Yoshizawa, ShengMing Zhou, Riichirou Negishi, et al.
Acta Crystallographica. Section A, Foundations of Crystallography|June 19, 2009
Formation of interference fringes in the Bragg-(Bragg)m-Laue modeKenji Hirano, Tomoe Fukamachi, Masami Yoshizawa, et al.
Journal of Applied Crystallography|September 27, 2013
Strain distribution in an Si single crystal measured by interference fringes of X-ray mirage diffractionSukswat Jongsukswat, Tomoe Fukamachi, Dongying Ju, et al.
Acta Crystallographica. Section A, Foundations and Advances|November 7, 2019
X-ray interference fringes from a weakly bent plane-parallel crystal with negative strain gradientTomoe Fukamachi, Sukswat Jongsukswat, Dongying Ju, et al.
Journal of Applied Crystallography|June 20, 2015
Erratum: An X-ray diffractometer using mirage diffraction. ErratumTomoe Fukamachi, Sukswat Jongsukswat, Dongying Ju, et al.
Journal of Synchrotron Radiation|April 23, 2004
Change of lattice distortion images in X-ray topography with resonant scattering in the Laue caseRiichirou Negishi, Masami Yoshizawa, Shengming Zhou, et al.
Journal of Applied Crystallography|September 23, 2014
An X-ray diffractometer using mirage diffractionTomoe Fukamachi, Sukswat Jongsukswat, Dongying Ju, et al.
Pageof 2

Showing results (1-10 of 14) with videos related to

Sort By:
Pageof 2
Acta Crystallographica. Section A, Foundations and Advances|September 1, 2022
Origin of irregular X-ray mirage fringes from a bent, thin crystalTomoe Fukamachi, Takaaki Kawamura
Acta Crystallographica. Section A, Foundations of Crystallography|October 26, 2005
Anomalous scattering factor determined by semicircle fitting near the K-absorption edge of GeMasami Yoshizawa, Shengming Zhou, Riichirou Negishi, et al.
Acta Crystallographica. Section A, Foundations of Crystallography|October 22, 2002
Extinction effect and Borrmann effect of resonant dynamical scattering in the Bragg caseTomoe Fukamachi, Riichirou Negishi, ShengMing Zhou, et al.
Acta Crystallographica. Section A, Foundations of Crystallography|February 21, 2008
Precise determination of anomalous scattering factors of Ge by using X-ray resonant scatteringMasami Yoshizawa, ShengMing Zhou, Riichirou Negishi, et al.
Acta Crystallographica. Section A, Foundations of Crystallography|June 19, 2009
Formation of interference fringes in the Bragg-(Bragg)m-Laue modeKenji Hirano, Tomoe Fukamachi, Masami Yoshizawa, et al.
Journal of Applied Crystallography|September 27, 2013
Strain distribution in an Si single crystal measured by interference fringes of X-ray mirage diffractionSukswat Jongsukswat, Tomoe Fukamachi, Dongying Ju, et al.
Acta Crystallographica. Section A, Foundations and Advances|November 7, 2019
X-ray interference fringes from a weakly bent plane-parallel crystal with negative strain gradientTomoe Fukamachi, Sukswat Jongsukswat, Dongying Ju, et al.
Journal of Applied Crystallography|June 20, 2015
Erratum: An X-ray diffractometer using mirage diffraction. ErratumTomoe Fukamachi, Sukswat Jongsukswat, Dongying Ju, et al.
Journal of Synchrotron Radiation|April 23, 2004
Change of lattice distortion images in X-ray topography with resonant scattering in the Laue caseRiichirou Negishi, Masami Yoshizawa, Shengming Zhou, et al.
Journal of Applied Crystallography|September 23, 2014
An X-ray diffractometer using mirage diffractionTomoe Fukamachi, Sukswat Jongsukswat, Dongying Ju, et al.
Pageof 2