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Xiuguo Chen

Showing results (1-10 of 47) with videos related to

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Optics Express|December 19, 2025
TFSolver: a numerical Python toolkit for parallel electromagnetic calculation of planar multilayer thin films at multi-wavelength and multi-angleShuo Liu, Xiuguo Chen, Shiyuan Liu
Applied Optics|June 4, 2019
In-line wavefront aberration adjustment of a projection lens for a lithographic tool using the dominant mode methodZhiyong Yang, Xiuguo Chen, Hao Jiang, et al.
Applied Optics|June 17, 2020
Fast reconstruction of the aberrated scanning lithographic image by a quadratic imaging model and an integral transfer functionZhiyong Yang, Xiuguo Chen, Hao Jiang, et al.
Applied Optics|May 14, 2015
Calibration of misalignment errors in composite waveplates using Mueller matrix ellipsometryHonggang Gu, Shiyuan Liu, Xiuguo Chen, et al.
Optics Letters|December 15, 2023
X-ray-based overlay metrology using reciprocal space slicing analysisJiahao Zhang, Xiuguo Chen, Tianjuan Yang, et al.
Applied Optics|October 3, 2013
Improved measurement accuracy in optical scatterometry using correction-based library searchXiuguo Chen, Shiyuan Liu, Chuanwei Zhang, et al.
Optics Express|October 17, 2014
Robust solution to the inverse problem in optical scatterometryJinlong Zhu, Shiyuan Liu, Xiuguo Chen, et al.
Optics Letters|April 3, 2020
Attitude metrology based on the field-of-view effect of birefringence using high-speed polarimetrySong Zhang, Hao Jiang, Honggang Gu, et al.
Optics Express|April 27, 2022
Superachromatic polarization modulator for stable and complete polarization measurement over an ultra-wide spectral rangeHonggang Gu, Hao Jiang, Xiuguo Chen, et al.
Optics Express|May 15, 2020
High-speed Mueller matrix ellipsometer with microsecond temporal resolutionSong Zhang, Hao Jiang, Honggang Gu, et al.
Pageof 5

Showing results (1-10 of 47) with videos related to

Sort By:
Pageof 5
Optics Express|December 19, 2025
TFSolver: a numerical Python toolkit for parallel electromagnetic calculation of planar multilayer thin films at multi-wavelength and multi-angleShuo Liu, Xiuguo Chen, Shiyuan Liu
Applied Optics|June 4, 2019
In-line wavefront aberration adjustment of a projection lens for a lithographic tool using the dominant mode methodZhiyong Yang, Xiuguo Chen, Hao Jiang, et al.
Applied Optics|June 17, 2020
Fast reconstruction of the aberrated scanning lithographic image by a quadratic imaging model and an integral transfer functionZhiyong Yang, Xiuguo Chen, Hao Jiang, et al.
Applied Optics|May 14, 2015
Calibration of misalignment errors in composite waveplates using Mueller matrix ellipsometryHonggang Gu, Shiyuan Liu, Xiuguo Chen, et al.
Optics Letters|December 15, 2023
X-ray-based overlay metrology using reciprocal space slicing analysisJiahao Zhang, Xiuguo Chen, Tianjuan Yang, et al.
Applied Optics|October 3, 2013
Improved measurement accuracy in optical scatterometry using correction-based library searchXiuguo Chen, Shiyuan Liu, Chuanwei Zhang, et al.
Optics Express|October 17, 2014
Robust solution to the inverse problem in optical scatterometryJinlong Zhu, Shiyuan Liu, Xiuguo Chen, et al.
Optics Letters|April 3, 2020
Attitude metrology based on the field-of-view effect of birefringence using high-speed polarimetrySong Zhang, Hao Jiang, Honggang Gu, et al.
Optics Express|April 27, 2022
Superachromatic polarization modulator for stable and complete polarization measurement over an ultra-wide spectral rangeHonggang Gu, Hao Jiang, Xiuguo Chen, et al.
Optics Express|May 15, 2020
High-speed Mueller matrix ellipsometer with microsecond temporal resolutionSong Zhang, Hao Jiang, Honggang Gu, et al.
Pageof 5