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The Journal of Physical Chemistry. A|October 21, 2020
Classical Correlation Model of Resonance Raman SpectroscopyY Gao, D E Aspnes, S Franzen
Applied Optics|April 17, 2010
Imaging performance of mirror pairs for grazing-incidence applications: a comparisonD E Aspnes
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|March 10, 2004
Optimizing precision of rotating-analyzer and rotating-compensator ellipsometersD E Aspnes
Applied Optics|February 16, 2010
Precision bounds to ellipsometer systemsD E Aspnes
Applied Optics|October 14, 2010
Optical-standard surfaces of single-crystal silicon for calibrating ellipsometers and reflectometersT Yasuda, D E Aspnes
Applied Optics|January 23, 2010
Geometrically exact ellipsometer alignmentD E Aspnes, A A Studna
Applied Optics|February 6, 2010
High precision scanning ellipsometerD E Aspnes, A A Studna
The Review of Scientific Instruments|March 1, 1978
Methods for drift stabilization and photomultiplier linearization for photometric ellipsometers and polarimetersD E Aspnes, A A Studna
The Journal of Physical Chemistry. A|January 10, 2022
Classical Model of Surface Enhanced Infrared Absorption (SEIRA) SpectroscopyYuan Gao, D E Aspnes, Stefan Franzen
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|February 24, 2001
Detection and analysis of depolarization artifacts in rotating-compensator polarimetersS F Li, J Opsal, H Chu, et al.
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