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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 1, 2022
Contrast Mechanisms in Secondary Electron e-Beam-Induced Current (SEEBIC) ImagingOndrej Dyck, Jacob L Swett, Charalambos Evangeli, et al.
Journal of Electron Microscopy|January 23, 2009
Atomic-resolution spectroscopic imaging: past, present and futureStephen J Pennycook, Maria Varela, Andrew R Lupini, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 4, 2008
Spatial resolution and information transfer in scanning transmission electron microscopyYiping Peng, Mark P Oxley, Andrew R Lupini, et al.
Scientific Reports|March 9, 2017
Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathwaysXiahan Sang, Andrew R Lupini, Jilai Ding, et al.
Small (Weinheim an Der Bergstrasse, Germany)|May 19, 2023
Hollow Ptychography: Toward Simultaneous 4D Scanning Transmission Electron Microscopy and Electron Energy Loss SpectroscopyNa Yeon Kim, Shaohong Cao, Karren L More, et al.
Small (Weinheim an Der Bergstrasse, Germany)|November 11, 2021
Sculpting the Plasmonic Responses of Nanoparticles by Directed Electron Beam IrradiationKevin M Roccapriore, Shin-Hum Cho, Andrew R Lupini, et al.
Physical Review. E|October 3, 2019
Structure retrieval from four-dimensional scanning transmission electron microscopy: Statistical analysis of potential pitfalls in high-dimensional dataXin Li, Ondrej Dyck, Stephen Jesse, et al.
Small Methods|March 21, 2022
Mapping Conductance and Switching Behavior of Graphene Devices In SituOndrej Dyck, Jacob L Swett, Charalambos Evangeli, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 20, 2014
Combined scanning transmission electron microscopy tilt- and focal seriesTim Dahmen, Jean-Pierre Baudoin, Andrew R Lupini, et al.
Advanced Materials (Deerfield Beach, Fla.)|June 13, 2023
Top-Down Fabrication of Atomic Patterns in Twisted Bilayer GrapheneOndrej Dyck, Sinchul Yeom, Andrew R Lupini, et al.
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