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Ultramicroscopy|November 10, 2018
A continuous sampling pattern design algorithm for atomic force microscopy imagesYufan Luo, Sean B AnderssonMicron (Oxford, England : 1993)|January 14, 2020
Image reconstruction for sub-sampled atomic force microscopy images using deep neural networksYufan Luo, Sean B AnderssonNanotechnology|November 21, 2015
A comparison of reconstruction methods for undersampled atomic force microscopy imagesYufan Luo, Sean B AnderssonOptics Express|July 8, 2009
Localization of a fluorescent source without numerical fittingSean B AnderssonIEEE Transactions on Nanobioscience|January 26, 2008
Curve tracking for rapid imaging in AFMSean B AnderssonPlos One|May 21, 2021
Expectation maximization based framework for joint localization and parameter estimation in single particle tracking from segmented imagesYe Lin, Sean B AnderssonControl Conference (ECC) ... European. European Control Conference|January 26, 2022
Computationally efficient application of Sequential Monte Carlo expectation maximization to confined single particle trackingYe Lin, Sean B AnderssonInternational Journal of Molecular Sciences|April 5, 2018
Feature Tracking for High Speed AFM Imaging of BiopolymersBrett Hartman, Sean B AnderssonProceedings of the ASME Dynamic Systems and Control Conference. ASME Dynamic Systems and Control Conference|September 10, 2021
OBSERVER-BASED CONTROL OF A DUAL-STAGE PIEZOELECTRIC SCANNERYuhe Chang, Sean B AnderssonProceedings of the ... American Control Conference. American Control Conference|September 6, 2021
EM-based algorithms for single particle tracking of Ornstein-Uhlenbeck motion from sCMOS camera dataYe Lin, Sean B AnderssonPageof 8