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Zhongye Xie

Showing results (1-10 of 7) with videos related to

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Optics Letters|October 14, 2022
High-performance multi-parameter fiber sensor by grating-enhanced Mach-Zehnder interferenceBoyao Li, Yaoyao Liang, Zhongye Xie, et al.
Optics Express|February 7, 2018
Surface and thickness measurement of transparent thin-film layers utilizing modulation-based structured-illumination microscopyZhongye Xie, Yan Tang, Yi Zhou, et al.
Frontiers in Neurorobotics|July 11, 2024
Curiosity model policy optimization for robotic manipulator tracking control with input saturation in uncertain environmentTu Wang, Fujie Wang, Zhongye Xie, et al.
Optics Express|May 5, 2019
Accurate surface profilometry using differential optical sectioning microscopy with structured illuminationZhongye Xie, Yan Tang, Jinhua Feng, et al.
Optics Express|September 13, 2019
Fast structured illumination microscopy with reflectance disturbance resistibility and improved accuracyZhongye Xie, Yan Tang, Yu He, et al.
Applied Optics|June 18, 2021
Fast structured illumination microscopy with a large dynamic measurement rangeChenhaolei Han, Yan Tang, Zhongye Xie, et al.
Applied Optics|November 2, 2019
Fast surface profilometry utilizing structured illumination microscopy based on the time-domain phase-shift techniqueLei Liu, Yan Tang, Zhongye Xie, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Optics Letters|October 14, 2022
High-performance multi-parameter fiber sensor by grating-enhanced Mach-Zehnder interferenceBoyao Li, Yaoyao Liang, Zhongye Xie, et al.
Optics Express|February 7, 2018
Surface and thickness measurement of transparent thin-film layers utilizing modulation-based structured-illumination microscopyZhongye Xie, Yan Tang, Yi Zhou, et al.
Frontiers in Neurorobotics|July 11, 2024
Curiosity model policy optimization for robotic manipulator tracking control with input saturation in uncertain environmentTu Wang, Fujie Wang, Zhongye Xie, et al.
Optics Express|May 5, 2019
Accurate surface profilometry using differential optical sectioning microscopy with structured illuminationZhongye Xie, Yan Tang, Jinhua Feng, et al.
Optics Express|September 13, 2019
Fast structured illumination microscopy with reflectance disturbance resistibility and improved accuracyZhongye Xie, Yan Tang, Yu He, et al.
Applied Optics|June 18, 2021
Fast structured illumination microscopy with a large dynamic measurement rangeChenhaolei Han, Yan Tang, Zhongye Xie, et al.
Applied Optics|November 2, 2019
Fast surface profilometry utilizing structured illumination microscopy based on the time-domain phase-shift techniqueLei Liu, Yan Tang, Zhongye Xie, et al.
Pageof 1