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Journal of Applied Crystallography|February 13, 2023
Advice on describing Bayesian analysis of neutron and X-ray reflectometryAndrew R McCluskey, Andrew J Caruana, Christy J Kinane, et al.Journal of Applied Crystallography|December 8, 2025
Erratum: A simple goniometer-compatible flow cell for serial synchrotron X-ray crystallography. CorrigendumSwagatha Ghosh, Doris Zorić, Peter Dahl, et al.Journal of Applied Crystallography|August 14, 2020
Iterative X-ray spectroscopic ptychographyHuibin Chang, Ziqin Rong, Pablo Enfedaque, et al.Journal of Applied Crystallography|August 14, 2020
Pulse-to-pulse wavefront sensing at free-electron lasers using ptychographySimone Sala, Benedikt J Daurer, Michal Odstrcil, et al.Journal of Applied Crystallography|August 14, 2020
PtyNAMi: ptychographic nano-analytical microscopeAndreas Schropp, Ralph Döhrmann, Stephan Botta, et al.Journal of Applied Crystallography|August 14, 2020
A new parafocusing paradigm for X-ray diffractionDanae Prokopiou, James McGovern, Gareth Davies, et al.Journal of Applied Crystallography|July 21, 2020
Sub-millisecond time-resolved small-angle neutron scattering measurements at NISTCharles Glinka, Markus Bleuel, Peter Tsai, et al.Journal of Applied Crystallography|July 21, 2020
Full reciprocal-space mapping up to 2000 K under controlled atmosphere: the multipurpose QMAX furnaceRené Guinebretière, Stephan Arnaud, Nils Blanc, et al.Journal of Applied Crystallography|July 21, 2020
Near, far, wherever you are: simulations on the dose efficiency of holographic and ptychographic coherent imagingMing Du, Doǧa Gürsoy, Chris JacobsenJournal of Applied Crystallography|July 21, 2020
Dual-energy crystal-analyzer scheme for spectral tomographyDenis Zolotov, Alexey Buzmakov, Maxim Grigoriev, et al.Pageof 112