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Journal of Applied Crystallography|December 11, 2020
speckle-tracking: a software suite for ptychographic X-ray speckle trackingAndrew J Morgan, Kevin T Murray, Harry M Quiney, et al.Journal of Applied Crystallography|November 20, 2012
A fast, simple and robust protocol for growing crystals in the lipidic cubic phaseMargaret Aherne, Joseph A Lyons, Martin CaffreyJournal of Applied Crystallography|May 18, 2013
The current approach to initial crystallization screening of proteins is under-sampledFabrice GorrecJournal of Applied Crystallography|May 18, 2013
Automatic processing of macromolecular crystallography X-ray diffraction data at the ESRFStéphanie Monaco, Elspeth Gordon, Matthew W Bowler, et al.Journal of Applied Crystallography|February 12, 2013
Implementation and performance of SIBYLS: a dual endstation small-angle X-ray scattering and macromolecular crystallography beamline at the Advanced Light SourceScott Classen, Greg L Hura, James M Holton, et al.Journal of Applied Crystallography|February 12, 2013
Directional pair distribution function for diffraction line profile analysis of atomistic modelsAlberto Leonardi, Matteo Leoni, Paolo ScardiJournal of Applied Crystallography|February 12, 2013
Experience with exchange and archiving of raw data: comparison of data from two diffractometers and four software packages on a series of lysozyme crystalsSimon W M Tanley, Antoine M M Schreurs, John R Helliwell, et al.Journal of Applied Crystallography|April 19, 2013
Bayesian reconstruction of P(r) directly from two-dimensional detector images via a Markov chain Monte Carlo methodSudeshna Paul, Alan M Friedman, Chris Bailey-Kellogg, et al.Journal of Applied Crystallography|September 19, 2013
Three-dimensional rocking curve imaging to measure the effective distortion in the neighbourhood of a defect within a crystal: an ice exampleArmelle Philip, Jacques Meyssonnier, Rafael T Kluender, et al.Journal of Applied Crystallography|September 19, 2013
Defect structure transformation after thermal annealing in a surface layer of Zn-implanted Si(001) substratesKirill Shcherbachev, Vladimir Privezentsev, Vaclav Kulikauskas, et al.Pageof 112