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Journal of Electron Microscopy|July 9, 2010
Crack propagation of single crystal beta-Sn during in situ TEM strainingP J Shang, Z Q Liu, D X Li, et al.
Journal of Electron Microscopy|September 28, 2010
In situ hydride formation in titanium during focused ion millingRengen Ding, Ian P Jones
Journal of Electron Microscopy|January 1, 1990
Fine structure of mitochondrial helical filaments revealed by computer image analysesH Sasaki, M van Heel, E Zeitler, et al.
Journal of Electron Microscopy|January 1, 1990
Immunocytochemical localization of amelogenin in rat incisor ameloblasts using ultrathin frozen sectionsS Nishikawa, T Takagi, S Sasa
Journal of Electron Microscopy|June 17, 2010
Measurement of electric field distribution using a conventional transmission electron microscopeKatsuhiro Sasaki, Hiroto Mori, Nobuyuki Tanaka, et al.
Journal of Electron Microscopy|November 27, 2010
Mass microscopy: high-resolution imaging mass spectrometryMitsutoshi Setou, Nobuya Kurabe
Journal of Electron Microscopy|January 24, 2009
Aberration-corrected ADF-STEM depth sectioning and prospects for reliable 3D imaging in S/TEMHuolin L Xin, David A Muller
Journal of Electron Microscopy|October 12, 2010
Development of a cryogenic stage for an ion-milling instrumentMasami Terauchi, Futami Satou, Hideo Sugizaki, et al.
Journal of Electron Microscopy|May 29, 1998
Spherulitic brushite stone in the dental pulp of a cowT Kodaka, A Hirayama, R Mori, et al.
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