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Journal of Microscopy|June 18, 2002
Direct modulation of the effective sensitivity of a CCD detector: a new approach to time-resolved fluorescence imagingA C Mitchell, J E Wall, J G Murray, et al.Journal of Microscopy|May 9, 2002
Characterizing the deformed state in Al-0.1 Mg alloy using high-resolution electron backscattered diffractionP J Hurley, F J HumphreysJournal of Microscopy|May 9, 2002
Characterization of textured NiO films for application as buffer layers in high temperature superconducting tapesT G Woodcock, J S Abell, M G HallJournal of Microscopy|May 10, 2002
Rapid cryofixation of rabbit muscle fibres after a temperature jumpP M Bennett, A Tsaturyan, S BershitskyJournal of Microscopy|May 10, 2002
Improving the quality of electron backscatter diffraction (EBSD) patterns from nanoparticlesJ A Small, J R Michael, D S BrightJournal of Microscopy|May 10, 2002
Stereological length estimation using spherical probesP R Mouton, A M Gokhale, N L Ward, et al.Journal of Microscopy|May 10, 2002
Adaptive correction of depth-induced aberrations in multiphoton scanning microscopy using a deformable mirrorL Sherman, J Y Ye, O Albert, et al.Journal of Microscopy|June 5, 2001
High-speed scanning by dual feedback control in SNOM/AFMA Egawa, N Chiba, K Homma, et al.Journal of Microscopy|June 5, 2001
Femtosecond near-field scanning optical microscopyB A Nechay, U Siegner, M Achermann, et al.Pageof 485