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Journal of Microscopy|October 25, 2006
Local structure studies of Fe-Nb-B metallic glasses using electron diffractionA Hirata, Y Hirotsu, T Ohkubo, et al.Journal of Microscopy|October 25, 2006
Quantitative high resolution transmission electron microscopy of nanostructured semiconductorsW Neumann, H Kirmse, I Häusler, et al.Journal of Microscopy|October 25, 2006
Piezoelectric field around threading dislocation in GaN determined on the basis of high-resolution transmission electron microscopy imageG Maciejewski, S Kret, P RuteranaJournal of Microscopy|October 25, 2006
Microstructure and electrical properties of diborides modified by rapid thermal annealingW Zagozdzon-Wosik, I Rusakova, C Darne, et al.Journal of Microscopy|October 25, 2006
TEM studies of the nitrided Ni-Ti surface layerJ Lelatko, P Paczkowski, T Wierzchoń, et al.Journal of Microscopy|October 25, 2006
Advances and problems with TEM characterization of Cr/CrN multilayer coatingsJ Morgiel, L Major, B Major, et al.Journal of Microscopy|October 25, 2006
New developments in the characterization of dislocation loops from LACBED patternsJ P Morniroli, R K W Marceau, S P RingerJournal of Microscopy|October 25, 2006
Electron crystallography applied to the structure determination of Nb(Cu,Al,X) Laves phasesM Gigla, J Lelatko, M Krzelowski, et al.Journal of Microscopy|October 25, 2006
Shear banding in twinned structure of copper deformed at 77 KH A Paul, A Morawiec, E Bouzy, et al.Journal of Microscopy|October 25, 2006
Identification and quantification of microstructures formed during nanocrystallization of amorphous (Fe, Co)-Nb-(Si, B) systemsM Deanko, D M Kepaptsoglou, D Muller, et al.Pageof 486