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Journal of Research of the National Institute of Standards and Technology|November 21, 2017
1993 Intercomparison of Photometric Units Maintained at NIST (USA) and PTB (Germany)Yoshihiro Ohno, Georg SauterJournal of Research of the National Institute of Standards and Technology|November 21, 2017
Optical Emission Spectroscopy on the Gaseous Electronics Conference RF Reference CellJ R RobertsJournal of Research of the National Institute of Standards and Technology|November 21, 2017
An Inductively Coupled Plasma Source for the Gaseous Electronics Conference RF Reference CellPaul A Miller, Gregory A Hebner, Kenneth E Greenberg, et al.Journal of Research of the National Institute of Standards and Technology|November 21, 2017
Potential and Current Distributions Calculated Across a Quantum Hall Effect Sample at Low and High CurrentsM E Cage, C F LavineJournal of Research of the National Institute of Standards and Technology|May 16, 2022
Characterization of 3-Dimensional Printing and Casting Materials for use in Magnetic Resonance Imaging Phantoms at 3 TB E Yunker, K F Stupic, J L Wagner, et al.Journal of Research of the National Institute of Standards and Technology|June 1, 2022
Optical Quantum Memory and its Applications in Quantum Communication SystemsLijun Ma, Oliver Slattery, Xiao TangJournal of Research of the National Institute of Standards and Technology|March 31, 2015
Analysis of 1-Minute Potentially Available Fluoride from DentifriceClifton M Carey, Erin C Holahan, Burton D SchmuckJournal of Research of the National Institute of Standards and Technology|March 12, 2024
X-Ray Computed Tomography Instrument Performance Evaluation, Part III: Sensitivity to Detector Geometry and Rotation Stage Errors at Different MagnificationsPrashanth Jaganmohan, Bala Muralikrishnan, Meghan Shilling, et al.Journal of Research of the National Institute of Standards and Technology|March 12, 2024
Estimation of a Minimum Allowable Structural Strength Based on Uncertainty in Material Test DataJeffrey T Fong, N Alan Heckert, James J Filliben, et al.Journal of Research of the National Institute of Standards and Technology|July 17, 2024
An Initial Look at Federal Offices of Research and Technology ApplicationsNicole Gingrich, Michael Hall, Isaac PattersonPageof 111