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Ultramicroscopy|June 2, 2023
A correction for higher-order refraction in cathodoluminescence spectrometryMichael Stöger-Pollach, Keanu Zenz, Felix Ursin, et al.Ultramicroscopy|June 4, 2023
Atomic imaging with a 12 T magnetic field perpendicular or parallel to the sample surface by an ultra-stable scanning tunneling microscopeJihao Wang, Weixuan Li, Wenjie Meng, et al.Ultramicroscopy|February 28, 2026
Dose constraints for high-resolution imaging of biological specimens with extreme ultraviolet and soft X-ray radiationChang Liu, Leona Licht, Jan RothhardtUltramicroscopy|February 22, 2026
Atomic-scale observation of vacancy ordering in magnetite nanoparticlesZlatko Nedelkoski, Paul M Sharp, Julio A do Nascimento, et al.Ultramicroscopy|November 30, 2024
Effect of the surrounding environment on electron beam irradiation damage of enhanced green fluorescent proteinHaruyoshi Osakabe, Mihiro Suzuki, Toshiki Shimizu, et al.Ultramicroscopy|May 8, 2026
Detective quantum efficiency of the Timepix4 hybrid pixel detector and its application to parallel-beam diffractionZhiyuan Ding, Nina Dimova, Jonathan S Barnard, et al.Ultramicroscopy|May 22, 2026
Optimized L<sub>1</sub>-norm smoothing gradient improves electron tomography's tilt series alignment with both localized and virtual fiducial markersXinyan Li, Zihe Xu, Shengkai Guo, et al.Ultramicroscopy|March 21, 2026
Compressive multi-beam scanning transmission electron microscopyAkira Yasuhara, Takumi Sannomiya, Ryoichi HorisakiUltramicroscopy|May 26, 2026
New universal technique for plan-view FIB preparation with no additional equipment or manual manipulationsAdrian Zavodov, Ilya KrupatinUltramicroscopy|June 11, 2026
Quantitative contact-resonance AFM reconstruction for artifact-reduced modulus and subsurface imaging on textured surfacesMingyu Duan, Zhongwei Li, Hui Li, et al.Pageof 458