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Ultramicroscopy|February 6, 2021
Automated geometric aberration correction for large-angle illumination STEMRyo Ishikawa, Riku Tanaka, Shigeyuki Morishita, et al.
Ultramicroscopy|February 4, 2017
Automated discrete electron tomography - Towards routine high-fidelity reconstruction of nanomaterialsXiaodong Zhuge, Hiroshi Jinnai, Rafal E Dunin-Borkowski, et al.
Ultramicroscopy|March 5, 2017
From a physicist's toy to an indispensable analytical tool in many fields of science: A personal view of the leading contribution of Ondrej Krivanek to the spectacular successes of EELS spectroscopy in the electron microscopeChristian Colliex
Ultramicroscopy|March 5, 2017
Single-atom detection of light elements: Imaging or spectroscopy?Ryosuke Senga, Kazu Suenaga
Ultramicroscopy|March 13, 2017
Characterization of misfit dislocations in Si quantum well structures enabled by STEM based aberration correctionPhilip E Batson, Maureen J Lagos
Ultramicroscopy|March 16, 2017
Hybrid statistics-simulations based method for atom-counting from ADF STEM imagesAnnelies De Wael, Annick De Backer, Lewys Jones, et al.
Ultramicroscopy|March 19, 2017
Simulation in elemental mapping using aberration-corrected electron microscopyL J Allen
Ultramicroscopy|August 6, 2019
Sparse coding and dictionary learning for electron hologram denoisingSatoshi Anada, Yuki Nomura, Tsukasa Hirayama, et al.
Ultramicroscopy|December 14, 2004
Toward time-resolved soft X-ray microscopy using pulsed fs-high-harmonic radiationM Wieland, Ch Spielmann, U Kleineberg, et al.
Ultramicroscopy|November 24, 2004
Modeling electric-field-sensitive scanning probe measurements for a tip of arbitrary shapeIrma Kuljanishvili, Subhasish Chakraborty, I J Maasilta, et al.
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