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Ultramicroscopy

Showing results (111-120 of 4,741) with videos related to

Pageof 475
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Ultramicroscopy|February 9, 2021
Inversion of dynamical Bragg intensities to complex structure factors by iterated projections. For Ultramic. 2020. ("Pico" Festschrift, May 2021)John C H Spence, Jeffrey J Donatelli
Ultramicroscopy|February 5, 2021
Adaptive domain misorientation approach for the EBSD measurement of deformation induced dislocation sub-structuresPauli Lehto
Ultramicroscopy|February 6, 2021
Automated geometric aberration correction for large-angle illumination STEMRyo Ishikawa, Riku Tanaka, Shigeyuki Morishita, et al.
Ultramicroscopy|February 4, 2017
Automated discrete electron tomography - Towards routine high-fidelity reconstruction of nanomaterialsXiaodong Zhuge, Hiroshi Jinnai, Rafal E Dunin-Borkowski, et al.
Ultramicroscopy|March 5, 2017
From a physicist's toy to an indispensable analytical tool in many fields of science: A personal view of the leading contribution of Ondrej Krivanek to the spectacular successes of EELS spectroscopy in the electron microscopeChristian Colliex
Ultramicroscopy|March 5, 2017
Single-atom detection of light elements: Imaging or spectroscopy?Ryosuke Senga, Kazu Suenaga
Ultramicroscopy|March 6, 2017
Ondrej Krivanek: A Research Life in EELS and Aberration Corrected STEMMichel Bosman, Gerald Kothleitner
Ultramicroscopy|March 13, 2017
Characterization of misfit dislocations in Si quantum well structures enabled by STEM based aberration correctionPhilip E Batson, Maureen J Lagos
Ultramicroscopy|March 16, 2017
Hybrid statistics-simulations based method for atom-counting from ADF STEM imagesAnnelies De Wael, Annick De Backer, Lewys Jones, et al.
Ultramicroscopy|March 19, 2017
Simulation in elemental mapping using aberration-corrected electron microscopyL J Allen
Pageof 475

Showing results (111-120 of 4,741) with videos related to

Sort By:
Pageof 475
Ultramicroscopy|February 9, 2021
Inversion of dynamical Bragg intensities to complex structure factors by iterated projections. For Ultramic. 2020. ("Pico" Festschrift, May 2021)John C H Spence, Jeffrey J Donatelli
Ultramicroscopy|February 5, 2021
Adaptive domain misorientation approach for the EBSD measurement of deformation induced dislocation sub-structuresPauli Lehto
Ultramicroscopy|February 6, 2021
Automated geometric aberration correction for large-angle illumination STEMRyo Ishikawa, Riku Tanaka, Shigeyuki Morishita, et al.
Ultramicroscopy|February 4, 2017
Automated discrete electron tomography - Towards routine high-fidelity reconstruction of nanomaterialsXiaodong Zhuge, Hiroshi Jinnai, Rafal E Dunin-Borkowski, et al.
Ultramicroscopy|March 5, 2017
From a physicist's toy to an indispensable analytical tool in many fields of science: A personal view of the leading contribution of Ondrej Krivanek to the spectacular successes of EELS spectroscopy in the electron microscopeChristian Colliex
Ultramicroscopy|March 5, 2017
Single-atom detection of light elements: Imaging or spectroscopy?Ryosuke Senga, Kazu Suenaga
Ultramicroscopy|March 6, 2017
Ondrej Krivanek: A Research Life in EELS and Aberration Corrected STEMMichel Bosman, Gerald Kothleitner
Ultramicroscopy|March 13, 2017
Characterization of misfit dislocations in Si quantum well structures enabled by STEM based aberration correctionPhilip E Batson, Maureen J Lagos
Ultramicroscopy|March 16, 2017
Hybrid statistics-simulations based method for atom-counting from ADF STEM imagesAnnelies De Wael, Annick De Backer, Lewys Jones, et al.
Ultramicroscopy|March 19, 2017
Simulation in elemental mapping using aberration-corrected electron microscopyL J Allen
Pageof 475