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Ultramicroscopy|August 1, 1990
Electrochemical deposition of molecular adsorbates for in situ scanning probe microscopyL A Nagahara, T Thundat, P I Oden, et al.Ultramicroscopy|December 23, 2011
Aberrations of the cathode objective lens up to fifth orderR M Tromp, W Wan, S M SchrammUltramicroscopy|July 19, 2011
High resolution surface morphology measurements using EBSD cross-correlation techniques and AFMM D Vaudin, G Stan, Y B Gerbig, et al.Ultramicroscopy|July 19, 2011
Fabrication and analysis of cylindrical resin AFM microcantileversD Cheneler, J Bowen, S J Leigh, et al.Ultramicroscopy|June 14, 2011
APT analysis of WC-Co based cemented carbidesJonathan Weidow, Hans-Olof AndrénUltramicroscopy|June 14, 2011
Mask-assisted deterministic phase-amplitude retrieval from a single far-field intensity diffraction pattern: two experimental proofs of principle using visible lightSergey G Podorov, Alexis I Bishop, David M Paganin, et al.Ultramicroscopy|June 14, 2011
A holographic biprism as a perfect energy filter?Jo Verbeeck, Giovanni Bertoni, Hannes LichteUltramicroscopy|June 14, 2011
Persistent misconceptions about incoherence in electron microscopyD Van DyckUltramicroscopy|August 26, 2011
Exploring different inelastic projection mechanisms for electron tomographyB Goris, S Bals, W Van den Broek, et al.Ultramicroscopy|August 26, 2011
Visualization of vortex core polarity in NiFe nanodots by tilted Fresnel imagesDuc-The Ngo, Stephen McVitiePageof 458