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Ultramicroscopy|March 12, 2017
Effects of accelerating voltage and specimen thickness on the spatial resolution of transmission electron backscatter diffraction in CuJhih-Wun Shih, Ka-Wei Kuo, Jui-Chao Kuo, et al.Ultramicroscopy|February 19, 2017
Modified automatic term selection v2: A faster algorithm to calculate inelastic scattering cross-sectionsJán RuszUltramicroscopy|March 10, 2017
Atom-counting in High Resolution Electron Microscopy:TEM or STEM - That's the questionJ Gonnissen, A De Backer, A J den Dekker, et al.Ultramicroscopy|March 14, 2017
Excitonic, vibrational, and van der Waals interactions in electron energy loss spectroscopyT Mizoguchi, T Miyata, W OlovssonUltramicroscopy|February 21, 2017
Real-space mapping of electronic orbitalsStefan Löffler, Matthieu Bugnet, Nicolas Gauquelin, et al.Ultramicroscopy|January 3, 2017
High-resolution scanning precession electron diffraction: Alignment and spatial resolutionJonathan S Barnard, Duncan N Johnstone, Paul A MidgleyUltramicroscopy|December 10, 2016
The application of in situ analytical transmission electron microscopy to the study of preferential intergranular oxidation in Alloy 600M G Burke, G Bertali, E Prestat, et al.Ultramicroscopy|October 17, 2016
Magnetic phase shift reconstruction for uniformly magnetized nanowiresAzadeh Akhtari-Zavareh, Marc De Graef, Karen L KavanaghUltramicroscopy|October 1, 2016
EBSD spatial resolution for detecting sigma phase in steelsS Fernandez Bordín, S Limandri, J M Ranalli, et al.Ultramicroscopy|November 19, 2016
Broad ion beam serial section tomographyB Winiarski, A Gholinia, K Mingard, et al.Pageof 460