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Ultramicroscopy|October 17, 2016
Magnetic phase shift reconstruction for uniformly magnetized nanowiresAzadeh Akhtari-Zavareh, Marc De Graef, Karen L KavanaghUltramicroscopy|October 1, 2016
EBSD spatial resolution for detecting sigma phase in steelsS Fernandez Bordín, S Limandri, J M Ranalli, et al.Ultramicroscopy|November 19, 2016
Broad ion beam serial section tomographyB Winiarski, A Gholinia, K Mingard, et al.Ultramicroscopy|October 1, 2016
The development of the spatially correlated adjustment wavelet filter for atomic force microscopy dataAndrzej Sikora, Aleksander Rodak, Olgierd Unold, et al.Ultramicroscopy|October 1, 2016
Dependence of the volume of an antibody on the force applied in a force microscopy experiment in liquidJorge Rodriguez-Ramos, Alma P Perrino, Ricardo GarciaUltramicroscopy|February 7, 2017
Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformationsD Schryvers, E K H Salje, M Nishida, et al.Ultramicroscopy|February 4, 2017
Measuring thermal conductivity of thin films by Scanning Thermal Microscopy combined with thermal spreading resistance analysisJ Juszczyk, A Kaźmierczak-Bałata, P Firek, et al.Ultramicroscopy|January 23, 2017
Tensor decompositions for the analysis of atomic resolution electron energy loss spectraJakob Spiegelberg, Ján Rusz, Kristiaan PelckmansUltramicroscopy|February 14, 2017
Fluctuation microscopy analysis of amorphous silicon modelsJ M Gibson, M M J TreacyUltramicroscopy|April 8, 2017
Twenty years after: How "Aberration correction in the STEM" truly placed a "A synchrotron in a Microscope"Quentin M RamassePageof 458