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Ultramicroscopy|July 4, 2012
A systematic method to identify the space group from PED and CBED patterns part II--practical examplesD Jacob, G Ji, J P MorniroliUltramicroscopy|July 21, 2012
Analysis of time-resolved interaction force mode AFM imaging using active and passive probesHasan Giray Oral, Zehra Parlak, F Levent DegertekinUltramicroscopy|July 21, 2012
An annealing algorithm to correct positioning errors in ptychographyA M Maiden, M J Humphry, M C Sarahan, et al.Ultramicroscopy|July 17, 2012
Orientation mapping of nanostructured materials using transmission Kikuchi diffraction in the scanning electron microscopePatrick W TrimbyUltramicroscopy|September 8, 2012
Highly reproducible low temperature scanning tunneling microscopy and spectroscopy with in situ prepared tipsAndres Castellanos-Gomez, Gabino Rubio-Bollinger, Manuela Garnica, et al.Ultramicroscopy|September 4, 2012
Robust elemental mapping of nanostructures at ultrahigh resolution using event-streamed spectrum imaging in an aberration-corrected analytical electron microscopeA A Herzing, I M AndersonUltramicroscopy|August 18, 2012
Defect structures in ZnO studied by high-resolution structural and spectroscopic imagingH Schmid, E Okunishi, W MaderUltramicroscopy|August 23, 2012
Correcting for AFM tip induced topography convolutions in protein-DNA samplesA T Winzer, C Kraft, S Bhushan, et al.Pageof 460