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Ultramicroscopy|July 3, 2004
Tip-to-sample distance dependence of an electrostatic force in KFM measurementsTakuji Takahashi, Shiano OnoUltramicroscopy|July 3, 2004
Investigation of the surface structure and elastic properties of calcium silicate hydrates at the nanoscaleCédric Plassard, Eric Lesniewska, Isabelle Pochard, et al.Ultramicroscopy|July 3, 2004
Characterization of self-assembling isolated ferroelectric domains by scanning force microscopyBongki Lee, Changdeuck Bae, Seung-Hyun Kim, et al.Ultramicroscopy|July 3, 2004
Applications of field-enhanced near-field optical microscopyA Bouhelier, M R Beversluis, L NovotnyUltramicroscopy|July 3, 2004
Towards phonon photonics: scattering-type near-field optical microscopy reveals phonon-enhanced near-field interactionRainer HillenbrandUltramicroscopy|July 3, 2004
Near-field magneto-optical analysis in reflection mode SNOMSatoshi Takahashi, Wayne Dickson, Robert Pollard, et al.Ultramicroscopy|January 1, 1992
Three-dimensional reconstruction of single particles embedded in iceP Penczek, M Radermacher, J FrankUltramicroscopy|February 8, 2005
Computer programs for unit-cell determination in electron diffraction experimentsX Z LiUltramicroscopy|February 8, 2005
Strategies for fabricating atom probe specimens with a dual beam FIBM K Miller, K F Russell, G B ThompsonUltramicroscopy|March 30, 2004
Determination of a misfit dislocation complex in SiGe/Si heterostructures by image deconvolution technique in HREMD Wang, J Zou, W Z He, et al.Pageof 458