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Ultramicroscopy|May 14, 2013
Measurement of indium concentration profiles and segregation efficiencies from high-angle annular dark field-scanning transmission electron microscopy imagesThorsten Mehrtens, Knut Müller, Marco Schowalter, et al.Ultramicroscopy|April 3, 2013
A flange on electron spectromicroscope with spherical deflector analyzer--simultaneous imaging of reciprocal and real spacesKrzysztof P GrzelakowskiUltramicroscopy|May 21, 2013
A response to the commentary on the paper "A comprehensive modeling and vibration analysis of AFM microcantilevers subjected to nonlinear tip-sample interaction forces" by Sohrab Eslami and Nader Jalili"Sohrab Eslami, Nader JaliliUltramicroscopy|May 22, 2013
Interaction of light and surface plasmon polaritons in Ag islands studied by nonlinear photoemission microscopyN M Buckanie, P Kirschbaum, S Sindermann, et al.Ultramicroscopy|May 22, 2013
Temporal and lateral electron pulse compression by a compact spherical electrostatic capacitorKrzysztof P Grzelakowski, Rudolf M TrompUltramicroscopy|January 8, 2013
Analysis of implanted silicon dopant profilesT J Prosa, D Olson, B Geiser, et al.Ultramicroscopy|January 8, 2013
The role of localized recoil in the formation of Kikuchi patternsAimo Winkelmann, Maarten VosUltramicroscopy|January 9, 2013
Nano-analysis of grain boundary and triple junction transport in nanocrystalline Ni/CuMohammed Reda Chellali, Zoltan Balogh, Guido SchmitzUltramicroscopy|December 25, 2012
Measurement of geometrically necessary dislocation density with high resolution electron backscatter diffraction: effects of detector binning and step sizeJ Jiang, T B Britton, A J WilkinsonUltramicroscopy|February 13, 2013
Defect analysis by statistical fitting to 3D atomic mapsZoltán Balogh, Christian Oberdorfer, Mohammed Reda Chellali, et al.Pageof 460