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Ultramicroscopy|December 17, 2014
Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-countingA De Backer, G T Martinez, K E MacArthur, et al.Ultramicroscopy|August 22, 2017
High-efficiency detector of secondary and backscattered electrons for low-dose imaging in the ESEMVilém Neděla, Eva Tihlaříková, Jiří Runštuk, et al.Ultramicroscopy|August 25, 2017
Characterization of trapped charges distribution in terms of mirror plot curveHassan N Al-Obaidi, Ali S Mahdi, Imad H KhaleelUltramicroscopy|August 12, 2017
Subsampling and inpainting approaches for electron tomographyToby Sanders, Christian DwyerUltramicroscopy|August 26, 2017
Improving microstructural quantification in FIB/SEM nanotomographyJoshua A Taillon, Christopher Pellegrinelli, Yi-Lin Huang, et al.Ultramicroscopy|September 29, 2015
Self-adapting denoising, alignment and reconstruction in electron tomography in materials scienceTony Printemps, Guido Mula, Daniele Sette, et al.Ultramicroscopy|August 31, 2015
Development of splitting convergent beam electron diffraction (SCBED)Florent Houdellier, Falk Röder, Etienne SnoeckUltramicroscopy|September 2, 2015
Determination of the incommensurate modulated structure of Bi(2)Sr(1.6)La(0.4)CuO(6+δ) by aberration-corrected transmission electron microscopyBinghui Ge, Yumei Wang, Huiqian Luo, et al.Ultramicroscopy|September 28, 2015
A phantom-based forward projection approach in support of model-based iterative reconstructions for HAADF-STEM tomographyS V Venkatakrishnan, L F Drummy, M A Jackson, et al.Ultramicroscopy|August 2, 2015
A scanning microscopy technique based on capacitive coupling with a field-effect transistor integrated with the tipKumjae Shin, Dae sil Kang, Sang hoon Lee, et al.Pageof 458