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Ultramicroscopy|October 7, 2018
Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffractionChristoph Mahr, Knut Müller-Caspary, Robert Ritz, et al.Ultramicroscopy|June 30, 2018
3D high resolution imaging for microelectronics: A multi-technique survey on copper pillarsA Fraczkiewicz, F Lorut, G Audoit, et al.Ultramicroscopy|June 30, 2018
Multiple strains and polar states in PbZr0.52Ti0.48O3/PbTiO3 superlattices revealed by aberration-corrected HAADF-STEM imagingY L Tang, Y L Zhu, Y J Wang, et al.Ultramicroscopy|August 25, 2018
Design of compact ultrafast microscopes for single- and multi-shot imaging with MeV electronsWeishi Wan, Fu-Rong Chen, Yimei ZhuUltramicroscopy|June 27, 2017
Aberration corrected STEM by means of diffraction gratingsMartin Linck, Peter A Ercius, Jordan S Pierce, et al.Ultramicroscopy|July 2, 2017
Dynamic modeling of trolling-mode AFM: Considering effects of cantilever torsion, nanoneedle flexibility and liquid-nanoneedle interactionsMohammadreza Sajjadi, Hossein Nejat Pishkenari, Gholamreza VossoughiUltramicroscopy|May 20, 2017
Monitoring the surface quality of silver plasmon waveguides with nonlinear photoemission electron microscopy and in-situ ion sputteringKellie Pearce, Francis Schuknecht, Christian Späth, et al.Ultramicroscopy|May 22, 2017
Imaging theory for the ISTEM imaging modeFlorian F Krause, Andreas Rosenauer, Dirk Van DyckUltramicroscopy|May 22, 2017
An identification of the soft polyelectrolyte gel-like layer on silica colloids using atomic force and electron microscopyJiří Škvarla, Juraj ŠkvarlaUltramicroscopy|May 31, 2017
Pulsed-voltage atom probe tomography of low conductivity and insulator materials by application of ultrathin metallic coating on nanoscale specimen geometryVahid R Adineh, Ross K W Marceau, Yu Chen, et al.Pageof 460