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Ultramicroscopy|December 16, 2017
Atomic force microscopy capable of vibration isolation with low-stiffness Z-axis actuationShingo Ito, Georg SchitterUltramicroscopy|September 16, 2017
Multiple beam ptychography for large field-of-view, high throughput, quantitative phase contrast imagingCharles Bevis, Robert Karl, Jonathan Reichanadter, et al.Ultramicroscopy|November 7, 2017
Reprint of Low-energy electron potentiometryJohannes Jobst, Jaap Kautz, Maria Mytiliniou, et al.Ultramicroscopy|February 8, 2018
Ewald sphere correction using a single side-band image processing algorithmChristopher J Russo, Richard HendersonUltramicroscopy|February 8, 2018
Microscopic charge fluctuations cause minimal contrast loss in cryoEMChristopher J Russo, Richard HendersonUltramicroscopy|February 8, 2018
In situ electrochemical AFM monitoring of the potential-dependent deterioration of platinum catalyst during potentiodynamic cyclingIvan Khalakhan, Andrei Choukourov, Mykhailo Vorokhta, et al.Ultramicroscopy|December 12, 2018
Dynamical modeling of manipulation process in Trolling-Mode AFMS Zahra Mohammadi, Majid Moghadam, Hossein Nejat PishkenariUltramicroscopy|March 20, 2018
Towards optimization of experimental parameters for studying Li-O2 battery discharge products in TEM using in situ EELSShibabrata Basak, Jacob Jansen, Yoones Kabiri, et al.Ultramicroscopy|December 21, 2018
A 0.5-T pure-in-plane-field magnetizing holder for in-situ Lorentz microscopyAkira Sugawara, Tomokazu Shimakura, Hiroyuki Nishihara, et al.Ultramicroscopy|December 17, 2018
Magnetic Cc/Cs-corrector compensating for the chromatic aberration and the spherical aberration of electron lensesH Rose, A Nejati, H MüllerPageof 458