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Ultramicroscopy|June 13, 2009
Bragg's Law diffraction simulations for electron backscatter diffraction analysisJosh Kacher, Colin Landon, Brent L Adams, et al.
Ultramicroscopy|March 24, 2009
Behaviour of TEM metal grids during in-situ heating experimentsZaoli Zhang, Dangsheng Su
Ultramicroscopy|June 6, 2009
Measurement of specimen thickness and composition in Al(x)Ga(1-x)N/GaN using high-angle annular dark field imagesAndreas Rosenauer, Katharina Gries, Knut Müller, et al.
Ultramicroscopy|June 6, 2009
Detective quantum efficiency of electron area detectors in electron microscopyG McMullan, S Chen, R Henderson, et al.
Ultramicroscopy|June 23, 2009
An improved ptychographical phase retrieval algorithm for diffractive imagingAndrew M Maiden, John M Rodenburg
Ultramicroscopy|June 26, 2009
Complementary techniques for the characterization of thin film Ti/Nb multilayersArda Genç, Rajarshi Banerjee, Gregory B Thompson, et al.
Ultramicroscopy|June 16, 2009
Bloch-wave-based STEM image simulation with layer-by-layer representationTakao Morimura, Masayuki Hasaka
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