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Ultramicroscopy|August 22, 2008
Observation of three-dimensional elemental distributions of a Si device using a 360 degrees -tilt FIB and the cold field-emission STEM systemToshie Yaguchi, Mitsuru Konno, Takeo Kamino, et al.Ultramicroscopy|August 12, 2008
The development of a glove-box/Vitrobot combination: air-water interface events visualized by cryo-TEMMatthijn R Vos, Paul H H Bomans, Peter M Frederik, et al.Ultramicroscopy|June 28, 2008
Capillary effects and instabilities in nanocontactsMichael Nosonovsky, Bharat BhushanUltramicroscopy|July 1, 2008
Novel photoactive aggregates of rhodamine 6G: dequenched and quasi-stable aggregates induced by a dewetting processAkihiro Tomioka, Atsushi Fujimoto, Shinji Kinoshita, et al.Ultramicroscopy|July 1, 2008
Charge drives for scanning probe microscope positioning stagesA J Fleming, K K LeangUltramicroscopy|July 1, 2008
MFM and gas adsorption isotherm analysis of proton beam irradiated multi-walled carbon nanotubesByungwook Kim, Jung-gil Lee, Euikwon Kim, et al.Ultramicroscopy|November 27, 2007
Uncooled infrared imaging device based on optimized optomechanical micro-cantilever arrayFengliang Dong, Qingchuan Zhang, Dapeng Chen, et al.Ultramicroscopy|November 26, 2008
Three-dimensional atom mapping of boron in implanted siliconO Cojocaru-Mirédin, E Cadel, B Deconihout, et al.Ultramicroscopy|November 4, 2008
Ion mixing at 20 keV: a comparison of the effects of Ga+, Ar+ and CF4+ ion irradiationA Barna, S Gurban, L Kotis, et al.Ultramicroscopy|November 11, 2008
Comparison of Mg L23 edges in MgO and Mg(OH)2--importance of medium-range structureNan Jiang, Dong Su, John C H SpencePageof 460