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Ultramicroscopy|December 16, 2014
Electron vortex beams prepared by a spiral aperture with the goal to measure EMCD on ferromagnetic films via STEMDarius Pohl, Sebastian Schneider, Jan Rusz, et al.
Ultramicroscopy|December 16, 2014
Quantitative investigation of SiGeC layers using atom probe tomographyRobert Estivill, Adeline Grenier, Sébastien Duguay, et al.
Ultramicroscopy|December 16, 2014
Detecting and extracting clusters in atom probe data: a simple, automated method using Voronoi cellsP Felfer, A V Ceguerra, S P Ringer, et al.
Ultramicroscopy|October 27, 2015
Development of an ellipse fitting method with which to analyse selected area electron diffraction patternsD R G Mitchell, J A Van den Berg
Ultramicroscopy|October 10, 2015
On the benefit of aberration-corrected HAADF-STEM for strain determination and its application to tailoring ferroelectric domain patternsY L Tang, Y L Zhu, X L Ma
Ultramicroscopy|October 20, 2015
Sample tilt effects on atom column position determination in ABF-STEM imagingDan Zhou, Knut Müller-Caspary, Wilfried Sigle, et al.
Ultramicroscopy|September 29, 2015
Effect of the laser pulse width on the field evaporation behavior of metals and oxidesH Wang, J Houard, L Arnoldi, et al.
Ultramicroscopy|September 19, 2015
Towards quantitative, atomic-resolution reconstruction of the electrostatic potential via differential phase contrast using electronsR Close, Z Chen, N Shibata, et al.
Ultramicroscopy|January 11, 2015
Towards quantitative electrostatic potential mapping of working semiconductor devices using off-axis electron holographySadegh Yazdi, Takeshi Kasama, Marco Beleggia, et al.
Ultramicroscopy|September 4, 2015
Critical conditions for atomic resolution imaging of molecular crystals by aberration-corrected HRTEMKaname Yoshida, Johannes Biskupek, Hiroki Kurata, et al.
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