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Ultramicroscopy|September 8, 2014
Comparison of optimal performance at 300keV of three direct electron detectors for use in low dose electron microscopyG McMullan, A R Faruqi, D Clare, et al.Ultramicroscopy|September 8, 2014
Comparison between magnetic force microscopy and electron back-scatter diffraction for ferrite quantification in type 321 stainless steelA D Warren, R L Harniman, A M Collins, et al.Ultramicroscopy|December 3, 2014
Electron imaging with an EBSD detectorStuart I Wright, Matthew M Nowell, René de Kloe, et al.Ultramicroscopy|December 3, 2014
Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: experimental demonstration at atomic resolutionTimothy J Pennycook, Andrew R Lupini, Hao Yang, et al.Ultramicroscopy|December 3, 2014
Catadioptric aberration correction in cathode lens microscopyR M TrompUltramicroscopy|November 19, 2013
Imaging endosomes and autophagosomes in whole mammalian cells using correlative cryo-fluorescence and cryo-soft X-ray microscopy (cryo-CLXM)Elizabeth M H Duke, Minoo Razi, Anne Weston, et al.Ultramicroscopy|November 19, 2013
Combined single cell AFM manipulation and TIRFM for probing the molecular stability of multilayer fibrinogen matricesW Christenson, I Yermolenko, B Plochberger, et al.Ultramicroscopy|March 26, 2013
Data mining for isotope discrimination in atom probe tomographyScott R Broderick, Aaron Bryden, Santosh K Suram, et al.Ultramicroscopy|November 9, 2013
AFM lateral force calibration for an integrated probe using a calibration gratingHuabin Wang, Michelle L GeePageof 460