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Ultramicroscopy|April 1, 1989
The resolution of photoelectron microscopes with UV, X-ray, and synchrotron excitation sourcesG F Rempfer, O H GriffithUltramicroscopy|July 18, 2015
Benchmark test of accelerated multi-slice simulation by GPGPUFumio Hosokawa, Takao Shinkawa, Yoshihiro Arai, et al.Ultramicroscopy|June 21, 2015
Microscopic analysis of the composition driven spin-reorientation transition in Ni(x)Pd(1-x)/Cu(001)Daniel M Gottlob, Hatice Doğanay, Florian Nickel, et al.Ultramicroscopy|April 25, 2015
Atomic scale study of CU clustering and pseudo-homogeneous Fe-Si nanocrystallization in soft magnetic FeSiNbB(CU) alloysK G Pradeep, G Herzer, D RaabeUltramicroscopy|May 26, 2015
Energy dispersive X-ray analysis on an absolute scale in scanning transmission electron microscopyZ Chen, A J D'Alfonso, M Weyland, et al.Ultramicroscopy|June 22, 2015
Brief history of the Cambridge STEM aberration correction project and its progenyL Michael Brown, Philip E Batson, Niklas Dellby, et al.Ultramicroscopy|August 21, 2022
Field dependent study on the impact of co-evaporated multihits and ion pile-up for the apparent stoichiometric quantification of GaN and AlNRichard J H Morris, Ramya Cuduvally, Jhao-Rong Lin, et al.Ultramicroscopy|November 13, 2022
A new TCAD simulation method for direct CMOS electron detectors optimizationO Marcelot, C Marcelot, F Corbière, et al.Ultramicroscopy|November 13, 2022
Quantitative analysis of mesoporous structures by electron tomography: A phantom studyXiaohui Huang, Dzmitry Hlushkou, Di Wang, et al.Pageof 458